{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T11:42:53Z","timestamp":1762429373881},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,7]]},"DOI":"10.1109\/prime.2019.8787805","type":"proceedings-article","created":{"date-parts":[[2019,8,5]],"date-time":"2019-08-05T21:18:06Z","timestamp":1565039886000},"page":"153-156","source":"Crossref","is-referenced-by-count":1,"title":["Conceptual Study for Ultra Miniaturized High-Precision Optical CMOS Sensors Unaffected by Gradients in Illumination"],"prefix":"10.1109","author":[{"given":"Andre","family":"Feiler","sequence":"first","affiliation":[]},{"given":"Dominik","family":"Veit","sequence":"additional","affiliation":[]},{"given":"Lukas","family":"Straczek","sequence":"additional","affiliation":[]},{"given":"Jurgen","family":"Oehm","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC.2013.6863988"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2014.7021218"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2010.5724636"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2335061"},{"key":"ref11","article-title":"Vorrichtung zur Messung des Einfallwinkels einer Strahlung","author":"oehm","year":"2011","journal-title":"Patent"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2555945"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2012.2194140"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2164669"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2013.6688498"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2012.6463764"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2009.5325982"}],"event":{"name":"2019 15th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)","start":{"date-parts":[[2019,7,15]]},"location":"Lausanne, Switzerland","end":{"date-parts":[[2019,7,18]]}},"container-title":["2019 15th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8777448\/8787731\/08787805.pdf?arnumber=8787805","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T17:48:36Z","timestamp":1658080116000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8787805\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/prime.2019.8787805","relation":{},"subject":[],"published":{"date-parts":[[2019,7]]}}}