{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T10:47:00Z","timestamp":1761130020663},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,6,12]],"date-time":"2022-06-12T00:00:00Z","timestamp":1654992000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,6,12]],"date-time":"2022-06-12T00:00:00Z","timestamp":1654992000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,6,12]]},"DOI":"10.1109\/prime55000.2022.9816820","type":"proceedings-article","created":{"date-parts":[[2022,7,11]],"date-time":"2022-07-11T19:59:09Z","timestamp":1657569549000},"page":"289-292","source":"Crossref","is-referenced-by-count":2,"title":["An Open-Circuit Voltage Pixel for Low-Light Visible Imaging in a Standard CMOS Process"],"prefix":"10.1109","author":[{"given":"Roman","family":"Fragasse","sequence":"first","affiliation":[{"name":"The Ohio State University,Columbus,OH,43212"}]},{"given":"Ramy","family":"Tantawy","sequence":"additional","affiliation":[{"name":"SenseICs Corporation,Columbus,OH,43212"}]},{"given":"Shane","family":"Smith","sequence":"additional","affiliation":[{"name":"The Ohio State University,Columbus,OH,43212"}]},{"given":"Suat","family":"Ay","sequence":"additional","affiliation":[{"name":"University of Idaho,Moscow,ID,83844"}]},{"given":"Waleed","family":"Khalil","sequence":"additional","affiliation":[{"name":"The Ohio State University,Columbus,OH,43212"}]}],"member":"263","event":{"name":"2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)","start":{"date-parts":[[2022,6,12]]},"location":"Villasimius, SU, Italy","end":{"date-parts":[[2022,6,15]]}},"container-title":["2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9816371\/9816743\/09816820.pdf?arnumber=9816820","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,5]],"date-time":"2022-08-05T00:38:58Z","timestamp":1659659938000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9816820\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6,12]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/prime55000.2022.9816820","relation":{},"subject":[],"published":{"date-parts":[[2022,6,12]]}}}