{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T07:06:20Z","timestamp":1725779180532},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,6,9]],"date-time":"2024-06-09T00:00:00Z","timestamp":1717891200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,9]],"date-time":"2024-06-09T00:00:00Z","timestamp":1717891200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,6,9]]},"DOI":"10.1109\/prime61930.2024.10559710","type":"proceedings-article","created":{"date-parts":[[2024,6,25]],"date-time":"2024-06-25T19:18:00Z","timestamp":1719343080000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Novel Device Fingerprinting Sensor Leveraging Back-End-of-Line Resistance and Capacitance"],"prefix":"10.1109","author":[{"given":"Jen-Chieh","family":"Hsueh","sequence":"first","affiliation":[{"name":"Ohio State University,ElectroScience Laboratory,Columbus,Ohio,43212"}]},{"given":"Michael","family":"Kines","sequence":"additional","affiliation":[{"name":"Ohio State University,ElectroScience Laboratory,Columbus,Ohio,43212"}]},{"given":"Sam","family":"Ellicott","sequence":"additional","affiliation":[{"name":"Ohio State University,ElectroScience Laboratory,Columbus,Ohio,43212"}]},{"given":"Shane","family":"Smith","sequence":"additional","affiliation":[{"name":"Ohio State University,ElectroScience Laboratory,Columbus,Ohio,43212"}]},{"given":"Waleed","family":"Khalil","sequence":"additional","affiliation":[{"name":"Ohio State University,ElectroScience Laboratory,Columbus,Ohio,43212"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2320516"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2012.6341361"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593228"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2903807"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.2209532"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2005.01.010"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2019.2913668"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2844899"}],"event":{"name":"2024 19th Conference on PhD Research in Microelectronics and Electronics (PRIME)","start":{"date-parts":[[2024,6,9]]},"location":"Larnaca, Cyprus","end":{"date-parts":[[2024,6,12]]}},"container-title":["2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10559643\/10559661\/10559710.pdf?arnumber=10559710","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,26]],"date-time":"2024-06-26T05:05:37Z","timestamp":1719378337000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10559710\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,9]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/prime61930.2024.10559710","relation":{},"subject":[],"published":{"date-parts":[[2024,6,9]]}}}