{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T22:38:32Z","timestamp":1761172712119,"version":"build-2065373602"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,9,21]],"date-time":"2025-09-21T00:00:00Z","timestamp":1758412800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,21]],"date-time":"2025-09-21T00:00:00Z","timestamp":1758412800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,9,21]]},"DOI":"10.1109\/prime66228.2025.11203740","type":"proceedings-article","created":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T17:07:31Z","timestamp":1761066451000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Photovoltaic Imaging in Standard BiCMOS with an Open-Circuit Voltage Pixel"],"prefix":"10.1109","author":[{"given":"Roman","family":"Fragasse","sequence":"first","affiliation":[{"name":"The Ohio State University,Columbus,OH,43212"}]},{"given":"Ramy","family":"Tantawy","sequence":"additional","affiliation":[{"name":"SenseICs Corporation,Columbus,OH,43212"}]},{"given":"Shane","family":"Smith","sequence":"additional","affiliation":[{"name":"The Ohio State University,Columbus,OH,43212"}]},{"given":"Megan","family":"Manifold","sequence":"additional","affiliation":[{"name":"SenseICs Corporation,Columbus,OH,43212"}]},{"given":"Suat","family":"Ay","sequence":"additional","affiliation":[{"name":"Worcester Polytechnic Institute,Worcester,MA,01609"}]},{"given":"Waleed","family":"Khalil","sequence":"additional","affiliation":[{"name":"The Ohio State University,Columbus,OH,43212"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/s23208383"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/5.0020000"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3068595"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PRIME55000.2022.9816820"},{"article-title":"A CMOS log image sensor with on-chip FPN compensation","volume-title":"The 27th European Solid-State Circuits Conference","author":"Ni","key":"ref5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3524244"},{"key":"ref7","article-title":"On Calculating the Current-Voltage Characteristic of MultiDiode Models for Organic Solar Cells","author":"Roberts","year":"2015","journal-title":"arXiv:1601.02679"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2009.2021805"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2013.6572036"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/4.545830"}],"event":{"name":"2025 20th International Conference on PhD Research in Microelectronics and Electronics (PRIME)","start":{"date-parts":[[2025,9,21]]},"location":"Taormina, Italy","end":{"date-parts":[[2025,9,24]]}},"container-title":["2025 20th International Conference on PhD Research in Microelectronics and Electronics (PRIME)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11203295\/11203299\/11203740.pdf?arnumber=11203740","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T05:26:11Z","timestamp":1761110771000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11203740\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9,21]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/prime66228.2025.11203740","relation":{},"subject":[],"published":{"date-parts":[[2025,9,21]]}}}