{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T06:11:59Z","timestamp":1761977519558,"version":"build-2065373602"},"reference-count":50,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,7,16]],"date-time":"2025-07-16T00:00:00Z","timestamp":1752624000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,16]],"date-time":"2025-07-16T00:00:00Z","timestamp":1752624000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,7,16]]},"DOI":"10.1109\/qrs-c65679.2025.00036","type":"proceedings-article","created":{"date-parts":[[2025,10,31]],"date-time":"2025-10-31T17:10:04Z","timestamp":1761930604000},"page":"222-231","source":"Crossref","is-referenced-by-count":0,"title":["Deep Learning-Based Cross-Project Defect Prediction: A Comprehensive Survey"],"prefix":"10.1109","author":[{"given":"Yifan","family":"Zou","sequence":"first","affiliation":[{"name":"Harbin Engineering University,College of Computer Science and Technology,Harbin,China"}]},{"given":"Huiqiang","family":"Wang","sequence":"additional","affiliation":[{"name":"Harbin Engineering University,College of Computer Science and Technology,Harbin,China"}]},{"given":"Hongwu","family":"Lv","sequence":"additional","affiliation":[{"name":"Harbin Engineering University,College of Computer Science and Technology,Harbin,China"}]},{"given":"Shuai","family":"Zhao","sequence":"additional","affiliation":[{"name":"Harbin Engineering University,College of Computer Science and Technology,Harbin,China"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1145\/3567550"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1007\/s10515-024-00424-1"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/j.jss.2023.111853"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.infsof.2024.107456"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1145\/3572905"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1145\/3387940.3391463"},{"year":"2024","article-title":"2024 crowdstrike incident \u2014 Wikipedia, the free encyclopedia","key":"ref7"},{"volume-title":"Crowdstrike analysis","year":"2024","key":"ref8"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1016\/j.infsof.2020.106287"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1142\/S0218194024500165"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TSE.2017.2720603"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1007\/s10515-024-00480-7"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TSE.2024.3381235"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1016\/j.jss.2023.111721"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/TSE.2020.2968520"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1016\/j.infsof.2022.106892"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1007\/s11219-022-09588-z"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/TR.2023.3305356"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1016\/j.jss.2022.111537"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/ACCESS.2019.2961129"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/ICCCN49398.2020.9209658"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/DSA52907.2021.00025"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/APSEC53868.2021.00044"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/ACCESS.2022.3214536"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1049\/2024\/5550801"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.3390\/app9132660"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.18293\/SEKE2019-070"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1109\/ACCESS.2019.2953696"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1109\/ACCESS.2020.2985780"},{"key":"ref30","first-page":"1","article-title":"Software visualization and deep transfer learning for effective software defect prediction","volume-title":"International Conference on Software Engineering (ICSE)","author":"Chen"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1007\/s11334-023-00542-1"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1016\/j.aej.2024.10.034"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1587\/transinf.2018EDP7289"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1109\/TSE.2018.2877612"},{"doi-asserted-by":"publisher","key":"ref35","DOI":"10.1109\/ACCESS.2022.3195039"},{"doi-asserted-by":"publisher","key":"ref36","DOI":"10.1109\/TR.2024.3435709"},{"doi-asserted-by":"publisher","key":"ref37","DOI":"10.1145\/3698109"},{"doi-asserted-by":"publisher","key":"ref38","DOI":"10.1109\/ACCESS.2020.3017101"},{"doi-asserted-by":"publisher","key":"ref39","DOI":"10.1007\/978-3-030-78609-0_28"},{"doi-asserted-by":"publisher","key":"ref40","DOI":"10.1016\/j.ins.2021.11.029"},{"doi-asserted-by":"publisher","key":"ref41","DOI":"10.1007\/s11219-021-09553-2"},{"doi-asserted-by":"publisher","key":"ref42","DOI":"10.1007\/s13369-022-07337-9"},{"doi-asserted-by":"publisher","key":"ref43","DOI":"10.1109\/ACCESS.2020.2981869"},{"doi-asserted-by":"publisher","key":"ref44","DOI":"10.1016\/j.patrec.2022.04.039"},{"doi-asserted-by":"publisher","key":"ref45","DOI":"10.1007\/s10664-023-10371-2"},{"doi-asserted-by":"publisher","key":"ref46","DOI":"10.32604\/cmc.2023.043680"},{"doi-asserted-by":"publisher","key":"ref47","DOI":"10.1049\/2024\/5102699"},{"doi-asserted-by":"publisher","key":"ref48","DOI":"10.1007\/s42979-024-03171-y"},{"doi-asserted-by":"publisher","key":"ref49","DOI":"10.1007\/s10664-024-10495-z"},{"doi-asserted-by":"publisher","key":"ref50","DOI":"10.1155\/2021\/2323100"}],"event":{"name":"2025 25th International Conference on Software Quality, Reliability, and Security Companion (QRS-C)","start":{"date-parts":[[2025,7,16]]},"location":"Hangzhou, China","end":{"date-parts":[[2025,7,20]]}},"container-title":["2025 25th International Conference on Software Quality, Reliability, and Security Companion (QRS-C)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11216429\/11216154\/11216481.pdf?arnumber=11216481","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T06:07:46Z","timestamp":1761977266000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11216481\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,16]]},"references-count":50,"URL":"https:\/\/doi.org\/10.1109\/qrs-c65679.2025.00036","relation":{},"subject":[],"published":{"date-parts":[[2025,7,16]]}}}