{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T06:13:04Z","timestamp":1761977584907,"version":"build-2065373602"},"reference-count":3,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,7,16]],"date-time":"2025-07-16T00:00:00Z","timestamp":1752624000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,16]],"date-time":"2025-07-16T00:00:00Z","timestamp":1752624000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,7,16]]},"DOI":"10.1109\/qrs-c65679.2025.00113","type":"proceedings-article","created":{"date-parts":[[2025,10,31]],"date-time":"2025-10-31T17:10:04Z","timestamp":1761930604000},"page":"796-797","source":"Crossref","is-referenced-by-count":0,"title":["Test Scenario Generation Method Based on the Extended Activity Diagram"],"prefix":"10.1109","author":[{"given":"Fei","family":"Yu","sequence":"first","affiliation":[{"name":"China Electronic Product Reliability and Environmental Testing Research Institute,Guangzhou,China"}]},{"given":"Jiaxi","family":"Xu","sequence":"additional","affiliation":[{"name":"China Electronic Product Reliability and Environmental Testing Research Institute,Guangzhou,China"}]},{"given":"Jingwei","family":"Shang","sequence":"additional","affiliation":[{"name":"China Electronic Product Reliability and Environmental Testing Research Institute,Guangzhou,China"}]}],"member":"263","reference":[{"issue":"01","key":"ref1","first-page":"61","article-title":"A method for generating concurrent test cases based on an extended activity diagram[J]","volume":"37","author":"Zhu","year":"2019","journal-title":"Aerospace Control"},{"volume-title":"Research and application of the automatic generation method of test cases for the SysML activity diagram model [D]","year":"2022","author":"Wang","key":"ref2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/sfw2.12009"}],"event":{"name":"2025 25th International Conference on Software Quality, Reliability, and Security Companion (QRS-C)","start":{"date-parts":[[2025,7,16]]},"location":"Hangzhou, China","end":{"date-parts":[[2025,7,20]]}},"container-title":["2025 25th International Conference on Software Quality, Reliability, and Security Companion (QRS-C)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11216429\/11216154\/11216524.pdf?arnumber=11216524","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T06:10:40Z","timestamp":1761977440000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11216524\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,16]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/qrs-c65679.2025.00113","relation":{},"subject":[],"published":{"date-parts":[[2025,7,16]]}}}