{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,9]],"date-time":"2026-03-09T19:52:18Z","timestamp":1773085938801,"version":"3.50.1"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2003]]},"DOI":"10.1109\/qsic.2003.1319121","type":"proceedings-article","created":{"date-parts":[[2005,4,12]],"date-time":"2005-04-12T14:25:04Z","timestamp":1113315904000},"page":"351-358","source":"Crossref","is-referenced-by-count":6,"title":["Testability analysis applied to embedded data-flow software"],"prefix":"10.1109","author":[{"family":"Thanh Binh Nguyen","sequence":"first","affiliation":[]},{"given":"M.","family":"Delaunay","sequence":"additional","affiliation":[]},{"given":"C.","family":"Robach","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2002.1167799"},{"key":"ref11","first-page":"111","article-title":"On evaluation of testability of protocol structures","author":"dssouli","year":"1993","journal-title":"Proceedings of the Intenational Workshop on Protocol Test Systems (IFIP)"},{"key":"ref12","first-page":"429","article-title":"Information based testability measures","author":"robach","year":"1986","journal-title":"Proceedings of Silicon Design Conference"},{"key":"ref13","first-page":"117","article-title":"Testability measures: a review","volume":"3","author":"robach","year":"1988","journal-title":"International Journal of Computer Systems Science and Engineering"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/0164-1212(93)90064-5"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/52.382180"},{"key":"ref4","author":"jungmayr","year":"2002","journal-title":"Proceedings of 12th International Workshop on Software Measurement"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/32.87281"},{"key":"ref6","first-page":"278","article-title":"Towards a unified approach to the testability of co-design system","author":"le","year":"0","journal-title":"Proceedings of IEEE International Symposium on Software Reliability Engineering"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/GLOCOM.1996.594448"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1976.233837"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/METRIC.1997.637169"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/115372.115320"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/42372.42379"},{"key":"ref1","author":"briggs","year":"1995"}],"event":{"name":"Third International Conference on Quality Software, 2003. Proceedings.","location":"Dallas, TX, USA","start":{"date-parts":[[2003,11,7]]},"end":{"date-parts":[[2003,11,7]]}},"container-title":["Third International Conference on Quality Software, 2003. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9215\/29226\/01319121.pdf?arnumber=1319121","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T22:13:58Z","timestamp":1489529638000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1319121\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/qsic.2003.1319121","relation":{},"subject":[],"published":{"date-parts":[[2003]]}}}