{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T01:10:02Z","timestamp":1755911402949,"version":"3.44.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2016,3,1]],"date-time":"2016-03-01T00:00:00Z","timestamp":1456790400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2016,3,1]],"date-time":"2016-03-01T00:00:00Z","timestamp":1456790400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,3]]},"DOI":"10.1109\/rait.2016.7507869","type":"proceedings-article","created":{"date-parts":[[2016,7,26]],"date-time":"2016-07-26T16:29:54Z","timestamp":1469550594000},"page":"25-28","source":"Crossref","is-referenced-by-count":1,"title":["An efficient methodology to solve the K-terminal network reliability problem"],"prefix":"10.1109","author":[{"given":"Sandeep","family":"Singh","sequence":"first","affiliation":[{"name":"Department of Applied Mathematics, Indian School of Mines, Dhanbad, India - 826004"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aman","family":"Verma","sequence":"additional","affiliation":[{"name":"Department of Applied Mathematics, Indian School of Mines, Dhanbad, India - 826004"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Chatterjee","sequence":"additional","affiliation":[{"name":"Department of Applied Mathematics, Indian School of Mines, Dhanbad, India - 826004"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Venkata","family":"Ramana","sequence":"additional","affiliation":[{"name":"Department of Applied Mathematics, Indian School of Mines, Dhanbad, India - 826004"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/0951-8320(93)90060-C"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/net.3230130107"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/net.3230220206"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/24.210267"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-57568-5_270"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1137\/0201010"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1986.4335431"},{"key":"ref17","first-page":"443","article-title":"OBDD-Based Evaluation of k-Terminal Network Reliability","volume":"r 51","author":"yeh","year":"2002","journal-title":"IEEE Transactions on Reliability"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/24.765927"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1986.4335422"},{"key":"ref3","first-page":"673","article-title":"Network reliability, Handbook of Operations Research: Network models","author":"ball","year":"1995","journal-title":"Elsevier North Holland"},{"journal-title":"The Combinatorics of Network Reliability","year":"1987","author":"colbourn","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/136035.136043"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/24.126676"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2007.898572"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0360-8352(98)00111-9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675141"},{"key":"ref9","first-page":"1224","article-title":"Syrel: A symbolic reliability algorithm based on path and cutest methods","volume":"c 36","year":"1987","journal-title":"IEEE Transactions on Reliability"}],"event":{"name":"2016 3rd International Conference on Recent Advances in Information Technology (RAIT)","start":{"date-parts":[[2016,3,3]]},"location":"Dhanbad, India","end":{"date-parts":[[2016,3,5]]}},"container-title":["2016 3rd International Conference on Recent Advances in Information Technology (RAIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7503253\/7507855\/07507869.pdf?arnumber=7507869","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T00:30:26Z","timestamp":1755909026000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7507869\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/rait.2016.7507869","relation":{},"subject":[],"published":{"date-parts":[[2016,3]]}}}