{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T23:09:50Z","timestamp":1772492990553,"version":"3.50.1"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,8]]},"DOI":"10.1109\/re.2015.7320422","type":"proceedings-article","created":{"date-parts":[[2015,11,5]],"date-time":"2015-11-05T22:57:15Z","timestamp":1446764235000},"page":"196-201","source":"Crossref","is-referenced-by-count":3,"title":["Inherent characteristics of traceability artifacts less is more"],"prefix":"10.1109","author":[{"given":"Jane Huffman","family":"Hayes","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Giulio","family":"Antoniol","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bram","family":"Adams","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yann-Gael","family":"Gueheneuc","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.412"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISESE.2005.1541838"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1096-908X(199705)9:3<127::AID-SMR149>3.0.CO;2-S"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1976.233837"},{"key":"ref14","author":"halstead","year":"1977","journal-title":"Elements of Software Science"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/32.153381"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1507195.1507204"},{"key":"ref17","first-page":"755","article-title":"Towards an Intelligent Domain-specific Traceability Solution","author":"guo","year":"2014"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICRE.2002.1048540"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2003.1201194"},{"key":"ref6","first-page":"116","article-title":"Tracing requirements to defect reports: an application of information retrieval techniques","volume":"1","author":"suresh","year":"2005","journal-title":"ISSE"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICRE.2003.1232745"},{"key":"ref8","article-title":"Helping Analysts Trace Requirements: An Objective Look","author":"hayes","year":"2004","journal-title":"International Conference on Requirements Engineering (RE'2004)"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-2239-5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2002.1041053"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISRE.1997.566866"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s11334-007-0024-1"}],"event":{"name":"2015 IEEE 23rd International Requirements Engineering Conference (RE)","location":"Ottawa, ON, Canada","start":{"date-parts":[[2015,8,24]]},"end":{"date-parts":[[2015,8,28]]}},"container-title":["2015 IEEE 23rd International Requirements Engineering Conference (RE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7310793\/7320393\/07320422.pdf?arnumber=7320422","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,25]],"date-time":"2017-03-25T02:36:58Z","timestamp":1490409418000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7320422\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,8]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/re.2015.7320422","relation":{},"subject":[],"published":{"date-parts":[[2015,8]]}}}