{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T12:01:50Z","timestamp":1725624110802},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,6]]},"DOI":"10.1109\/recosoc.2011.5981512","type":"proceedings-article","created":{"date-parts":[[2011,9,12]],"date-time":"2011-09-12T18:03:34Z","timestamp":1315850614000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["Self-reparable system on FPGA for single event upset recovery"],"prefix":"10.1109","author":[{"given":"Uros","family":"Legat","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anton","family":"Biasizzo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Franc","family":"Novak","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Error-Correcting Codes","year":"1980","author":"peterson","key":"ref10"},{"key":"ref11","article-title":"Ion beam testing of ALTERA APEX FPGA's","author":"ceschia","year":"0","journal-title":"IEEE NSREC Radiation Effects Data Workshop Record"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910426"},{"journal-title":"Correcting Single-Event Upsets Through Virtex Partial Configuration","year":"2000","author":"carmichael","key":"ref13"},{"key":"ref14","article-title":"Fault Tolerant ICAP Controller for High-Reliable Internal Scrubbing","author":"heiner","year":"0","journal-title":"Proc IEEE Aerospace Conf"},{"journal-title":"Correcting Single-Event Upsets in Virtex-4 FPGA Configuration Memory","year":"2009","author":"carmichael","key":"ref15"},{"journal-title":"SEU strategies for Virtex-5 devices","year":"2010","author":"chapman","key":"ref16"},{"key":"ref17","first-page":"372","article-title":"A new functional fault model for FPGA Application-Orianted testing","author":"rebaudengo","year":"0","journal-title":"Proc Defect and Fault Tolerance in VLSI Systems"},{"journal-title":"Virtex-4 FPGA Configuration User Guide","year":"2009","key":"ref18"},{"journal-title":"Virtex-5 FPGA Configuration User Guide","year":"2009","key":"ref19"},{"key":"ref4","article-title":"Radiation test results of the virtex FPGA and ZBT SRAM for space based reconfigurable computing","author":"fuller","year":"0","journal-title":"Proc MAPLD"},{"journal-title":"Continuing Experiments of Atmospheric Neutron Effects on Deep Submicron Integrated Circuits","year":"2009","author":"lesea","key":"ref3"},{"journal-title":"Triple Module Redundancy Design Techniques for Virtex FPGAs","year":"2001","author":"carmichael","key":"ref6"},{"journal-title":"Fault-Tolerance Techniques for SRAM-based FPGAs","year":"2006","author":"lima","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2003.1281354"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2001.1159293"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.854207"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/23.983162"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2005.860743"},{"journal-title":"Device Reliability Report","year":"2011","key":"ref20"},{"journal-title":"Virtex 5 SEU Critical Bit Information","year":"2010","author":"chapman","key":"ref21"}],"event":{"name":"2011 6th International Workshop on Reconfigurable Communication-Centric Systems-on-Chip (ReCoSoC)","start":{"date-parts":[[2011,6,20]]},"location":"Montpellier, France","end":{"date-parts":[[2011,6,22]]}},"container-title":["6th International Workshop on Reconfigurable Communication-Centric Systems-on-Chip (ReCoSoC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5967008\/5981488\/05981512.pdf?arnumber=5981512","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T11:05:14Z","timestamp":1490094314000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5981512\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,6]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/recosoc.2011.5981512","relation":{},"subject":[],"published":{"date-parts":[[2011,6]]}}}