{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T12:42:23Z","timestamp":1730292143510,"version":"3.28.0"},"reference-count":29,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/recosoc.2017.8016156","type":"proceedings-article","created":{"date-parts":[[2017,8,24]],"date-time":"2017-08-24T20:54:51Z","timestamp":1503608091000},"page":"1-8","source":"Crossref","is-referenced-by-count":6,"title":["High-level test generation for processing elements in many-core systems"],"prefix":"10.1109","author":[{"given":"Adeboye Stephen","family":"Oyeniran","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Raimund","family":"Ubar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Siavoosh Payandeh","family":"Azad","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jaan","family":"Raik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.5"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2009.118"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699277"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687436"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2311394"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4020-2801-4"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1219068"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/43.913755"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2005.68"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2208130"},{"journal-title":"Essentials of Electronic Testing","year":"2013","author":"bushnell","key":"ref28"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/9767139"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675602"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2005.44"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2009.5413156"},{"journal-title":"Self-Testing and Self-Repairing Embedded Processors Techniques for Statically Scheduled Superscalar Architectures","year":"2015","author":"sch\u00f6lzel","key":"ref29"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2014.6962088"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297676"},{"key":"ref7","first-page":"1","article-title":"VAST: Virtualization-Assisted Concurrent Autonomous Self-Test","author":"li","year":"2008","journal-title":"Proc International Test Conference (ITC)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2003.1240944"},{"key":"ref9","first-page":"1441","volume":"16","author":"gizopoulos","year":"2008","journal-title":"IEEE Trans on Systematic software-based self-test for pipelined processors"},{"key":"ref1","article-title":"Defect Tolerance in Homogeneous Manycore Processors Using Core-Level Redundancy with Unified Topology","author":"zhang","year":"2008","journal-title":"Design Automation and Test in Europe"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.15"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.186"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2036184"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2016.7482445"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3176\/proc.2014.1.08"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/BEC.2016.7743732"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2015.7396738"}],"event":{"name":"2017 12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC)","start":{"date-parts":[[2017,7,12]]},"location":"Madrid, Spain","end":{"date-parts":[[2017,7,14]]}},"container-title":["2017 12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8010994\/8016139\/08016156.pdf?arnumber=8016156","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,13]],"date-time":"2017-12-13T20:51:09Z","timestamp":1513198269000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8016156\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/recosoc.2017.8016156","relation":{},"subject":[],"published":{"date-parts":[[2017,7]]}}}