{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,18]],"date-time":"2025-11-18T09:14:54Z","timestamp":1763457294416},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,9]]},"DOI":"10.1109\/rfid-ta.2011.6068622","type":"proceedings-article","created":{"date-parts":[[2011,11,4]],"date-time":"2011-11-04T22:03:03Z","timestamp":1320444183000},"page":"95-102","source":"Crossref","is-referenced-by-count":10,"title":["RFID testing and evaluation for an RF-harsh environment"],"prefix":"10.1109","author":[{"given":"Allison J.","family":"Mercer","sequence":"first","affiliation":[]},{"given":"Ryan K.","family":"James","sequence":"additional","affiliation":[]},{"given":"Gisele","family":"Bennett","sequence":"additional","affiliation":[]},{"given":"Priyank","family":"Patel","sequence":"additional","affiliation":[]},{"given":"Chase","family":"Johnston","sequence":"additional","affiliation":[]},{"given":"James","family":"Cai","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"1","article-title":"An overview for companies seeking to use RFID technology to connect their IT systems directly to the ‘real’ world","year":"2005","journal-title":"RFID white paper Technology systems and applications"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/9780470168226"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S0377-2217(01)00281-8"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-84628-607-0_2"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-84628-607-0_3"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MAP.2009.5162013"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2009.5347254"},{"key":"ref3","article-title":"NIST Tests of the Wireless Environment in Automobile Manufacturing Facilities","author":"remley","year":"2008","journal-title":"NIST Technical Note 1550"},{"key":"ref6","article-title":"Experimental Investigation of EM I on RFID in Manufacturing Facilities","author":"cheng","year":"2009","journal-title":"5th Annual IEEE Conference on Automation Science and Engineering"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2006.874072"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/RFID.2007.346166"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2009.5117679"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1080\/13675560802168526"},{"key":"ref1","first-page":"85","author":"dobkin","year":"2008","journal-title":"The RF in RFID Passive UHF in Practice"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijpe.2010.07.039"}],"event":{"name":"2011 IEEE International Conference on RFID-Technologies and Applications (RFID-TA)","start":{"date-parts":[[2011,9,15]]},"location":"Sitges, Spain","end":{"date-parts":[[2011,9,16]]}},"container-title":["2011 IEEE International Conference on RFID-Technologies and Applications"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6058515\/6068591\/06068622.pdf?arnumber=6068622","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T17:46:11Z","timestamp":1490118371000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6068622\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/rfid-ta.2011.6068622","relation":{},"subject":[],"published":{"date-parts":[[2011,9]]}}}