{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T03:32:04Z","timestamp":1725593524945},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/rtsi.2019.8895570","type":"proceedings-article","created":{"date-parts":[[2019,11,13]],"date-time":"2019-11-13T09:45:32Z","timestamp":1573638332000},"page":"34-38","source":"Crossref","is-referenced-by-count":2,"title":["Closed-form Polarimetric Two-Scale Model for sea scattering evaluation"],"prefix":"10.1109","author":[{"given":"Gerardo","family":"di Martino","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alessio","family":"di Simone","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Antonio","family":"Iodice","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniele","family":"Riccio","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2015.2502425"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1029\/97JC00467"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/JOSA.44.000838"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1029\/2006GL026825"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2019.2904761"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2015.2440443"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.1968.1139147"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2013.2295235"},{"journal-title":"Microwave Remote Sensing","year":"1982","author":"ulaby","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/rds19683111057"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2011.2106792"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/36.134086"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/0959-7174\/4\/3\/008"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/36.655319"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2013.2238893"}],"event":{"name":"2019 IEEE 5th International forum on Research and Technology for Society and Industry (RTSI)","start":{"date-parts":[[2019,9,9]]},"location":"Florence, Italy","end":{"date-parts":[[2019,9,12]]}},"container-title":["2019 IEEE 5th International forum on Research and Technology for Society and Industry (RTSI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8890612\/8895511\/08895570.pdf?arnumber=8895570","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T21:51:47Z","timestamp":1658094707000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8895570\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/rtsi.2019.8895570","relation":{},"subject":[],"published":{"date-parts":[[2019,9]]}}}