{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T13:09:20Z","timestamp":1730293760726,"version":"3.28.0"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,9,6]],"date-time":"2021-09-06T00:00:00Z","timestamp":1630886400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,9,6]],"date-time":"2021-09-06T00:00:00Z","timestamp":1630886400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,9,6]],"date-time":"2021-09-06T00:00:00Z","timestamp":1630886400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,9,6]]},"DOI":"10.1109\/rtsi50628.2021.9597328","type":"proceedings-article","created":{"date-parts":[[2021,11,15]],"date-time":"2021-11-15T18:04:55Z","timestamp":1636999495000},"page":"502-506","source":"Crossref","is-referenced-by-count":0,"title":["Analog-to-Digital Converter Dynamic Testing by Linearized Four-Parameter Sine-Fit Algorithm"],"prefix":"10.1109","author":[{"given":"Daniel","family":"Belega","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dario","family":"Petri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/19.836314"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2021.103035"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1970.tb01766.x"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1983.4315077"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2008.08.006"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.1017714"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/19.119777"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.2307\/1403192"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.855082"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0920-5489(03)00062-X"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"4362","DOI":"10.1016\/j.measurement.2013.05.004","article-title":"A comparison of least squares and maximum likelihood methods using sine fitting in ADC testing","volume":"46","author":"\u0161aliga","year":"2013","journal-title":"Meas"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2218679"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2014.09.035"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2012.6229502"},{"key":"ref2","first-page":"1189","volume":"49","author":"h\u00e4ndel","year":"2000"},{"journal-title":"Standard for Terminology and Test Methods for Analog-to-Digital Converters","year":"2010","key":"ref1"},{"key":"ref9","volume":"1","author":"kay","year":"1993","journal-title":"Fundamentals of Statistical Signal Processing Estimation Theory"}],"event":{"name":"2021 IEEE 6th International Forum on Research and Technology for Society and Industry (RTSI)","start":{"date-parts":[[2021,9,6]]},"location":"Naples, Italy","end":{"date-parts":[[2021,9,9]]}},"container-title":["2021 IEEE 6th International Forum on Research and Technology for Society and Industry (RTSI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9597204\/9597208\/09597328.pdf?arnumber=9597328","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T12:50:47Z","timestamp":1652187047000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9597328\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,9,6]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/rtsi50628.2021.9597328","relation":{},"subject":[],"published":{"date-parts":[[2021,9,6]]}}}