{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,30]],"date-time":"2026-03-30T02:38:58Z","timestamp":1774838338021,"version":"3.50.1"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,9,6]],"date-time":"2021-09-06T00:00:00Z","timestamp":1630886400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,9,6]],"date-time":"2021-09-06T00:00:00Z","timestamp":1630886400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,9,6]],"date-time":"2021-09-06T00:00:00Z","timestamp":1630886400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,9,6]]},"DOI":"10.1109\/rtsi50628.2021.9597346","type":"proceedings-article","created":{"date-parts":[[2021,11,15]],"date-time":"2021-11-15T18:04:55Z","timestamp":1636999495000},"page":"86-90","source":"Crossref","is-referenced-by-count":3,"title":["Augmented Reality Laboratory for Instrumentationand Measurements Online Course"],"prefix":"10.1109","author":[{"given":"Annalisa","family":"Liccardo","sequence":"first","affiliation":[]},{"given":"Pasquale","family":"Arpaia","sequence":"additional","affiliation":[]},{"given":"Francesco","family":"Bonavolonta","sequence":"additional","affiliation":[]},{"given":"Francesco","family":"de Pandi","sequence":"additional","affiliation":[]},{"given":"Enzo","family":"Caputo","sequence":"additional","affiliation":[]},{"given":"Rosario Schiano","family":"Lo Moriello","sequence":"additional","affiliation":[]},{"given":"Antonio","family":"Gloria","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3101314"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC50364.2021.9459881"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"1124","DOI":"10.1109\/TIM.2007.899983","article-title":"Remote didactic laboratory “g. savastano,” the italian experience for e-learning at the technical universities in the field of electrical and electronic measurement: Architecture and optimization of the communication performance based on thin client technology","volume":"56","author":"andria","year":"2007","journal-title":"IEEE Transactions on Instrumentation and Measurement"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1080\/03043797.2017.1284764"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IWMN.2011.6088503"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3019615"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3035397"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MeMeA49120.2020.9137210"},{"key":"ref18","first-page":"1699","article-title":"Application of virtual instrumentation labview for power electronic system analysis","author":"spanik","year":"0","journal-title":"2006 12th International Power Electronics and Motion Control Conference"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.107584"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IWMN.2019.8805015"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/INDIN41052.2019.8972300"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10080939"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2005.1604458"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2006.328272"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1177\/2382120520951806"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SAS.2019.8706108"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"130","DOI":"10.1109\/TE.2014.2335712","article-title":"Improving the laboratory learning experience: A process to train and manage teaching assistants","volume":"58","author":"benetazzo","year":"2015","journal-title":"IEEE Transactions on Education"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TE.2013.2249516"},{"key":"ref20","first-page":"50","article-title":"Adopting smart metering rf networks for particulate matter distributed measurements","author":"carrat\u00f9","year":"0","journal-title":"IMEKO TC19 Symposium Metrology on Environmental Instrumentation and Measurements (EnvIMEKO 17)"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/MetroAeroSpace48742.2020.9160134"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.23919\/ICINS43216.2021.9470796"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/s21144851"}],"event":{"name":"2021 IEEE 6th International Forum on Research and Technology for Society and Industry (RTSI)","location":"Naples, Italy","start":{"date-parts":[[2021,9,6]]},"end":{"date-parts":[[2021,9,9]]}},"container-title":["2021 IEEE 6th International Forum on Research and Technology for Society and Industry (RTSI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9597204\/9597208\/09597346.pdf?arnumber=9597346","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T12:50:48Z","timestamp":1652187048000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9597346\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,9,6]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/rtsi50628.2021.9597346","relation":{},"subject":[],"published":{"date-parts":[[2021,9,6]]}}}