{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,27]],"date-time":"2025-12-27T03:46:25Z","timestamp":1766807185792,"version":"3.29.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,9,18]],"date-time":"2024-09-18T00:00:00Z","timestamp":1726617600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,9,18]],"date-time":"2024-09-18T00:00:00Z","timestamp":1726617600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,9,18]]},"DOI":"10.1109\/rtsi61910.2024.10761874","type":"proceedings-article","created":{"date-parts":[[2024,11,26]],"date-time":"2024-11-26T18:45:38Z","timestamp":1732646738000},"page":"243-247","source":"Crossref","is-referenced-by-count":2,"title":["Equivalent Circuit of Electrothermal Memristor Model Based on HfO<sub>2<\/sub>"],"prefix":"10.1109","author":[{"given":"Khitem","family":"Lahbacha","sequence":"first","affiliation":[{"name":"University of Cassino and Southern Lazio,Department Electrical and Information Engineering, DIEI,Cassino,Italy,03043"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Antonio","family":"Maffucci","sequence":"additional","affiliation":[{"name":"University of Cassino and Southern Lazio,Department Electrical and Information Engineering, DIEI,Cassino,Italy,03043"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1976.10092"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCT.1971.1083337"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2016.2618351"},{"key":"ref4","first-page":"1718","article-title":"Memristor based computation-in-memory architecture for data-intensive applications","volume-title":"IEEE Design, Automation & Test in Europe Conference & Exhibition","author":"Hamdioui"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s42341-019-00116-8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2021.111706"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2016.2618351"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1021\/nl901874j"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2016.2583673"},{"issue":"2","key":"ref10","article-title":"SPICE Model of Memristor with Nonlinear Dopant Drift","volume":"18","author":"Biolek","year":"2009","journal-title":"Radioengineering"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.2010583"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/SPI52361.2021.9505230"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/OJNANO.2021.3124846"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DTSS.2019.8915266"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DTS48731.2020.9196043"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/SaPIW.2019.8781680"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DTS52014.2021.9498259"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3036574"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2202320"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2091489"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/0143-0807\/30\/4\/001"}],"event":{"name":"2024 IEEE 8th Forum on Research and Technologies for Society and Industry Innovation (RTSI)","start":{"date-parts":[[2024,9,18]]},"location":"Milano, Italy","end":{"date-parts":[[2024,9,20]]}},"container-title":["2024 IEEE 8th Forum on Research and Technologies for Society and Industry Innovation (RTSI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10761112\/10761063\/10761874.pdf?arnumber=10761874","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T19:21:56Z","timestamp":1732735316000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10761874\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,9,18]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/rtsi61910.2024.10761874","relation":{},"subject":[],"published":{"date-parts":[[2024,9,18]]}}}