{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T13:17:55Z","timestamp":1730294275911,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,5]]},"DOI":"10.1109\/saci.2011.5873055","type":"proceedings-article","created":{"date-parts":[[2011,6,18]],"date-time":"2011-06-18T02:49:48Z","timestamp":1308365388000},"page":"499-504","source":"Crossref","is-referenced-by-count":1,"title":["Product defect prediction model"],"prefix":"10.1109","author":[{"given":"Ana Maria","family":"Vladu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sergiu Stelian","family":"Iliescu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ioana","family":"Fagarasan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/9780470382844"},{"journal-title":"In Praise of Defects","year":"2006","author":"laird","key":"ref3"},{"key":"ref10","first-page":"1","author":"wood","year":"1996","journal-title":"Software Reliability Growth Models Technical Report 96 1"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.4236\/jsea.2010.36070"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/b97414"},{"journal-title":"Defect Estimation Strategies","year":"2003","author":"nayak","key":"ref8"},{"key":"ref7","first-page":"675","article-title":"Body of Knowledge for Software Quality Measurement","volume":"25","author":"schneidewind","year":"1999","journal-title":"IEEE Computer"},{"key":"ref2","first-page":"386","volume":"xx","author":"kumar","year":"2006","journal-title":"Reliability and Six Sigma"},{"key":"ref9","first-page":"16","author":"dhiauddin","year":"2009","journal-title":"Defect Prediction Model for Testing Phase"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/32.815326"}],"event":{"name":"2011 6th IEEE International Symposium on Applied Computational Intelligence and Informatics (SACI)","start":{"date-parts":[[2011,5,19]]},"location":"Timisoara, Romania","end":{"date-parts":[[2011,5,21]]}},"container-title":["2011 6th IEEE International Symposium on Applied Computational Intelligence and Informatics (SACI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5783419\/5872967\/05873055.pdf?arnumber=5873055","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T10:17:01Z","timestamp":1490091421000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5873055\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/saci.2011.5873055","relation":{},"subject":[],"published":{"date-parts":[[2011,5]]}}}