{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,8]],"date-time":"2025-04-08T23:34:07Z","timestamp":1744155247924},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/saci.2015.7208200","type":"proceedings-article","created":{"date-parts":[[2015,8,20]],"date-time":"2015-08-20T17:52:02Z","timestamp":1440093122000},"page":"17-17","source":"Crossref","is-referenced-by-count":8,"title":["Deep learning for pattern learning and recognition"],"prefix":"10.1109","author":[{"given":"C. L. Philip","family":"Chen","sequence":"first","affiliation":[]}],"member":"263","event":{"name":"2015 IEEE 10th Jubilee International Symposium on Applied Computational Intelligence and Informatics (SACI)","start":{"date-parts":[[2015,5,21]]},"location":"Timisoara, Romania","end":{"date-parts":[[2015,5,23]]}},"container-title":["2015 IEEE 10th Jubilee International Symposium on Applied Computational Intelligence and Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7165000\/7208165\/07208200.pdf?arnumber=7208200","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T17:46:15Z","timestamp":1490377575000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7208200\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/saci.2015.7208200","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}