{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,17]],"date-time":"2026-02-17T03:32:03Z","timestamp":1771299123154,"version":"3.50.1"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T00:00:00Z","timestamp":1639699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T00:00:00Z","timestamp":1639699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,12,17]]},"DOI":"10.1109\/safeprocess52771.2021.9693575","type":"proceedings-article","created":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T20:50:05Z","timestamp":1643748605000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["A Data Driven RUL Prediction and Predictive Maintenance for Stochastic Degrading Systems"],"prefix":"10.1109","author":[{"given":"Yuhan","family":"Zhang","sequence":"first","affiliation":[{"name":"Peking University,College of Engineering,Beijing,P. R. China,100871"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xianchao","family":"Xiu","sequence":"additional","affiliation":[{"name":"Peking University,College of Engineering,Beijing,P. R. China,100871"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ying","family":"Yang","sequence":"additional","affiliation":[{"name":"Peking University,College of Engineering,Beijing,P. R. China,100871"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2182221"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2015.12.019"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.11.017"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.21629\/JSEE.2018.02.22"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2010.10.023"},{"key":"ref15","first-page":"211","article-title":"Sparse bayesian learning and the relevance vector machine","volume":"1","author":"tipping","year":"2001","journal-title":"Journal of Machine Learning Research"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.06.005"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2013.830074"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2838078"},{"key":"ref5","article-title":"A prognostic model based on dbn and diffusion process for degrading bearing","author":"hu","year":"2019","journal-title":"IEEE Transactions on Industrial Electronics"},{"key":"ref8","first-page":"1","article-title":"A remaining useful life prediction method in the early stage of stochastic degradation process","author":"zhang","year":"2020","journal-title":"IEEE Transactions on Circuits and Systems II Express Briefs"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2021.3073052"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2018.02.033"},{"key":"ref1","article-title":"Prognostics and health management of electronics","author":"pecht","year":"2009","journal-title":"Encyclopedia of Structural Health Monitoring"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2015.09.076"}],"event":{"name":"2021 CAA Symposium on Fault Detection, Supervision, and Safety for Technical Processes (SAFEPROCESS)","location":"Chengdu, China","start":{"date-parts":[[2021,12,17]]},"end":{"date-parts":[[2021,12,18]]}},"container-title":["2021 CAA Symposium on Fault Detection, Supervision, and Safety for Technical Processes (SAFEPROCESS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9693491\/9693537\/09693575.pdf?arnumber=9693575","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,20]],"date-time":"2022-06-20T21:11:20Z","timestamp":1655759480000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9693575\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,12,17]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/safeprocess52771.2021.9693575","relation":{},"subject":[],"published":{"date-parts":[[2021,12,17]]}}}