{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T16:44:18Z","timestamp":1725727458617},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T00:00:00Z","timestamp":1695340800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T00:00:00Z","timestamp":1695340800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,22]]},"DOI":"10.1109\/safeprocess58597.2023.10295669","type":"proceedings-article","created":{"date-parts":[[2023,11,3]],"date-time":"2023-11-03T13:47:19Z","timestamp":1699019239000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Defect Detection of Metal Sheets Based on Improved YOLOX Algorithm"],"prefix":"10.1109","volume":"37","author":[{"given":"Bing","family":"Luo","sequence":"first","affiliation":[{"name":"Southwest Jiaotong University,School of Electrical Engineering,Chengdu,China"}]},{"given":"Hongwei","family":"Wang","sequence":"additional","affiliation":[{"name":"Aerospace Measurement &#x0026; Control Corp.,Test and Diagnostic Products Division,Beijing,China"}]},{"given":"Jingkun","family":"Jia","sequence":"additional","affiliation":[{"name":"Aerospace Measurement &#x0026; Control Corp.,Test and Diagnostic Products Division,Beijing,China"}]},{"given":"Na","family":"Qin","sequence":"additional","affiliation":[{"name":"Southwest Jiaotong University,School of Electrical Engineering,Chengdu,China"}]},{"given":"Yuanfu","family":"Du","sequence":"additional","affiliation":[{"name":"Southwest Jiaotong University,School of Electrical Engineering,Chengdu,China"}]},{"given":"Linzi","family":"Xie","sequence":"additional","affiliation":[{"name":"Southwest Jiaotong University,School of Electrical Engineering,Chengdu,China"}]}],"member":"263","reference":[{"article-title":"Yolox: Exceeding yolo series in 2021","year":"2021","author":"ge","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2017.8053243"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW50498.2020.00203"},{"key":"ref4","first-page":"28","article-title":"Faster r-cnn: Towards real-time object detection with region proposal networks","author":"ren","year":"2015","journal-title":"Advances in neural information processing systems"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1162\/neco_a_01199"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.324"},{"key":"ref5","first-page":"2961","article-title":"Mask r-cnn","author":"he","year":"2017","journal-title":"Proceedings of the IEEE International Conference on Computer Vision"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"1904","DOI":"10.1109\/TPAMI.2015.2389824","article-title":"Spatial pyramid pooling in deep convolutional networks for visual recognition","volume":"37","author":"he","year":"2015","journal-title":"IEEE Transactions on Pattern Analysis and Machine Intelligence"},{"key":"ref2","first-page":"21","article-title":"Ssd: Single shot multibox detector","author":"liu","year":"2016","journal-title":"Computer Vision&#x2013;ECCV 2016 14th European Conference Amsterdam The Netherlands October 11&#x2013;14 2016 Proceedings Part I 14"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1186\/1687-5281-2014-50"}],"event":{"name":"2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)","start":{"date-parts":[[2023,9,22]]},"location":"Yibin, China","end":{"date-parts":[[2023,9,24]]}},"container-title":["2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10295546\/10295577\/10295669.pdf?arnumber=10295669","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,27]],"date-time":"2023-11-27T14:28:43Z","timestamp":1701095323000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10295669\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,22]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/safeprocess58597.2023.10295669","relation":{},"subject":[],"published":{"date-parts":[[2023,9,22]]}}}