{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,9]],"date-time":"2025-10-09T13:09:14Z","timestamp":1760015354202},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T00:00:00Z","timestamp":1695340800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T00:00:00Z","timestamp":1695340800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,22]]},"DOI":"10.1109\/safeprocess58597.2023.10295689","type":"proceedings-article","created":{"date-parts":[[2023,11,3]],"date-time":"2023-11-03T17:47:19Z","timestamp":1699033639000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["A Detection Approach for Wafer Detect in Industrial Manufacturing based on YOLOv8"],"prefix":"10.1109","author":[{"given":"Qian","family":"Tao","sequence":"first","affiliation":[{"name":"Soochow University,School of Mechanical and Electrical Engineering,Suzhou,China"}]},{"given":"Yiyang","family":"Chen","sequence":"additional","affiliation":[{"name":"Soochow University,School of Mechanical and Electrical Engineering,Suzhou,China"}]},{"given":"Hongtian","family":"Chen","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Automation,Shanghai,China"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2022.3201511"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.20517\/ir.2023.02"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2021.3060766"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3241981"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2019.2902657"},{"key":"ref14","first-page":"1","article-title":"An optimal iterative learning control approach for linear systems with nonuniform trial lengths under input constraints","author":"zhuang","year":"2022","journal-title":"IEEE Transactions on Systems Man and Cybernetics Systems"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DDCLS55054.2022.9858511"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.scitotenv.2018.09.322"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2022.04.025"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2018.2799214"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2022.118493"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108648"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2020.3029946"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ac1fbf"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3007292"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2022.09.128"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2020.2994357"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-020-09825-6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.eng.2019.01.014"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-018-6894-4"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2020.04.024"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2022.11.004"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2019.1683252"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108445"}],"event":{"name":"2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)","start":{"date-parts":[[2023,9,22]]},"location":"Yibin, China","end":{"date-parts":[[2023,9,24]]}},"container-title":["2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10295546\/10295577\/10295689.pdf?arnumber=10295689","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,27]],"date-time":"2023-11-27T19:28:58Z","timestamp":1701113338000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10295689\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,22]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/safeprocess58597.2023.10295689","relation":{},"subject":[],"published":{"date-parts":[[2023,9,22]]}}}