{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T23:34:23Z","timestamp":1780356863873,"version":"3.54.1"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T00:00:00Z","timestamp":1695340800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,22]],"date-time":"2023-09-22T00:00:00Z","timestamp":1695340800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,22]]},"DOI":"10.1109\/safeprocess58597.2023.10295891","type":"proceedings-article","created":{"date-parts":[[2023,11,3]],"date-time":"2023-11-03T17:47:19Z","timestamp":1699033639000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["Lightweight Neural Network-based Real-time PCB Defect Detection System"],"prefix":"10.1109","author":[{"given":"Yue","family":"Zhang","sequence":"first","affiliation":[{"name":"North China University of Technology,School of Electrical and Control Engineering,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"He","family":"Zou","sequence":"additional","affiliation":[{"name":"North China University of Technology,School of Electrical and Control Engineering,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jing","family":"Wang","sequence":"additional","affiliation":[{"name":"North China University of Technology,School of Electrical and Control Engineering,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhenwu","family":"Lei","sequence":"additional","affiliation":[{"name":"North China University of Technology,School of Electrical and Control Engineering,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Meng","family":"Zhou","sequence":"additional","affiliation":[{"name":"North China University of Technology,School of Electrical and Control Engineering,Beijing,China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICAICA52286.2021.9498174"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/su15043683"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.46904\/eea.21.69.2.1108006"},{"issue":"11","key":"ref4","first-page":"188","article-title":"A review of pcb defect detection using image processing","volume":"4","author":"Anoop","year":"2015","journal-title":"Intern. Journal of Engineering and Innovative Technology (IJEIT)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2019.100933"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/WiSPNET.2017.8299715"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-44673-7_12"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"1","DOI":"10.5772\/15751","article-title":"Introduction to the artificial neural networks","volume-title":"Artificial Neural Networks: Methodological Advances and Biomedical Applications","author":"Krenker","year":"2011"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-93025-1_4"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tcpmt.2011.2118208"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IWCMC48107.2020.9148099"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/el:20000342"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/6104.846932"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.2005.1518381"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1049\/trit.2019.0019"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3934\/mbe.2021223"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3208580"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.298"},{"key":"ref19","first-page":"448","article-title":"Batch normalization: Accelerating deep network training by reducing internal covariate shift","author":"Ioffe","year":"2015","journal-title":"International conference on machine learning. pmlr"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2017.02.029"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.17487\/rfc2326"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICoICT.2018.8528770"},{"issue":"173","key":"ref23","first-page":"2","article-title":"Nginx: the high-performance web server and reverse proxy","volume":"2008","author":"Reese","year":"2008","journal-title":"Linux Journal"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/WCSE.2013.38"}],"event":{"name":"2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)","location":"Yibin, China","start":{"date-parts":[[2023,9,22]]},"end":{"date-parts":[[2023,9,24]]}},"container-title":["2023 CAA Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10295546\/10295577\/10295891.pdf?arnumber=10295891","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T02:54:54Z","timestamp":1705028094000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10295891\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,22]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/safeprocess58597.2023.10295891","relation":{},"subject":[],"published":{"date-parts":[[2023,9,22]]}}}