{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T22:26:21Z","timestamp":1725488781437},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,7]]},"DOI":"10.1109\/samos.2016.7818356","type":"proceedings-article","created":{"date-parts":[[2017,1,19]],"date-time":"2017-01-19T21:30:13Z","timestamp":1484861413000},"page":"261-267","source":"Crossref","is-referenced-by-count":1,"title":["A hybrid ASIC\/FPGA fault-tolerant artificial pancreas"],"prefix":"10.1109","author":[{"given":"Michail","family":"Vavouras","sequence":"first","affiliation":[]},{"given":"Rui Policarpo","family":"Duarte","sequence":"additional","affiliation":[]},{"given":"Antonino","family":"Armato","sequence":"additional","affiliation":[]},{"given":"Christos-Savvas","family":"Bouganis","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2001.966761"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-63465-7_219"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/AHS.2007.59"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/AHS.2007.108"},{"journal-title":"Reliability Data Handbook Universal Model for Reliability Prediction of Electronics Components PCBs and Equipment","year":"0","key":"ref14"},{"journal-title":"Functional Safety and IEC 61508","year":"0","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/BioCAS.2011.6107735"},{"year":"0","key":"ref17"},{"journal-title":"Safety Integrity Level Manual PEPPERL+FUCHS","year":"0","key":"ref18"},{"year":"0","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1950413.1950419"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2003.1269336"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2003.1225959"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2013.08.008"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2009.5272543"},{"journal-title":"Fault-Tolerant Systems","year":"2007","author":"koren","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"journal-title":"Implantable microelectronic devices A comprehensive review","year":"2006","author":"strydis","key":"ref1"},{"key":"ref9","first-page":"214","article-title":"Dual use of superscalar datapath for transient-fault detection and recovery","author":"ray","year":"2001","journal-title":"Proceedings of the 34th Annual International Symposium on Microarchitecture (MICRO-34)"},{"year":"0","key":"ref20"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2000064.2000089"},{"year":"0","key":"ref21"},{"year":"0","key":"ref24"},{"journal-title":"International Technology Roadmap for Semiconductor","year":"0","key":"ref23"}],"event":{"name":"2016 International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation (SAMOS)","start":{"date-parts":[[2016,7,17]]},"location":"Agios Konstantinos, Samos Island, Greece","end":{"date-parts":[[2016,7,21]]}},"container-title":["2016 International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation (SAMOS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7803477\/7818316\/07818356.pdf?arnumber=7818356","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,13]],"date-time":"2017-12-13T15:22:22Z","timestamp":1513178542000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7818356\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,7]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/samos.2016.7818356","relation":{},"subject":[],"published":{"date-parts":[[2016,7]]}}}