{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T13:29:29Z","timestamp":1730294969590,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/sbcci.2013.6644856","type":"proceedings-article","created":{"date-parts":[[2013,10,30]],"date-time":"2013-10-30T20:12:39Z","timestamp":1383163959000},"page":"1-6","source":"Crossref","is-referenced-by-count":10,"title":["Reducing TMR overhead by combining approximate circuit, transistor topology and input permutation approaches"],"prefix":"10.1109","author":[{"given":"Iuri A. C.","family":"Gomes","sequence":"first","affiliation":[]},{"given":"Fernanda G. L.","family":"Kastensmidt","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250141"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.884352"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228504"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2012.6313868"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.839174"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813129"},{"key":"5","article-title":"Impact of technology trends on seu in cmos sram5","volume":"43","author":"dood et cxl","year":"1996","journal-title":"IEEE Transactionson Nuclear Science"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1988.32867"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.105"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105401"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1145\/1081081.1081115"},{"key":"12","article-title":"Using bulk built-in current sensors to detect soft errors","author":"henes neto","year":"2006","journal-title":"IEEE Computer Society September"}],"event":{"name":"2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI)","start":{"date-parts":[[2013,9,2]]},"location":"Curitiba, Brazil","end":{"date-parts":[[2013,9,6]]}},"container-title":["2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6634599\/6644849\/06644856.pdf?arnumber=6644856","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T20:21:21Z","timestamp":1490214081000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6644856\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/sbcci.2013.6644856","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}