{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T19:52:25Z","timestamp":1729626745775,"version":"3.28.0"},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/sbcci.2013.6644860","type":"proceedings-article","created":{"date-parts":[[2013,10,31]],"date-time":"2013-10-31T00:12:39Z","timestamp":1383178359000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["A methodology to evaluate the aging impact on flip-flops performance"],"prefix":"10.1109","author":[{"given":"Cicero","family":"Nunes","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paulo F.","family":"Butzen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andre I.","family":"Reis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Renato P.","family":"Ribas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.12.004"},{"key":"22","first-page":"52","article-title":"Analysis and design of lowenergyflip-flops","author":"markovic","year":"2001","journal-title":"Proceedings of International Symposium on LowPower Eletronics and Design"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/4.753687"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/4.58286"},{"key":"15","first-page":"439","article-title":"Analysis of reliability of flip-flops undertransistor aging effects in nano-scale CMOS technology","author":"rao","year":"2011","journal-title":"Proceedingsof IEEE International Conference on Computer Design"},{"key":"16","doi-asserted-by":"crossref","first-page":"869","DOI":"10.1109\/TCAD.2012.2237227","article-title":"Design and multicorneroptimization of the energy-delay product of cmos flip-flops underthe negative bias temperature instability effect","volume":"32","author":"abrishami","year":"2013","journal-title":"IEEE Trans Oncomputer-Aided Design of Integrated Circuits and Systems"},{"key":"13","first-page":"200","article-title":"Comparativeanalysis of NBTI effects on low power and high performance flip-flops","author":"ramakrishnan","year":"2008","journal-title":"Proceedings of IEEE International Conference on Computer Design"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2012.6231069"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2008810"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2013.6523590"},{"key":"21","doi-asserted-by":"crossref","first-page":"364","DOI":"10.1145\/1278480.1278573","article-title":"The Impact of NBTI on the Performance of Combinational and Sequential Circuits","author":"wenping wang","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2156414"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2040125"},{"key":"2","doi-asserted-by":"crossref","first-page":"559","DOI":"10.1016\/j.microrel.2007.01.063","article-title":"Gate oxidebreakdown in fet devices and circuits: From nanoscale physics tosystem-level reliability","volume":"47","author":"kaczer","year":"2007","journal-title":"Microelectronics Reliability"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.884870"},{"key":"10","article-title":"Analysis and comparison in the energy-delay-areadomain of nanometer CMOS flip-flops: Part i-methodology and designstrategies","author":"alioto","year":"2011","journal-title":"IEEE TVLSI"},{"key":"7","doi-asserted-by":"crossref","first-page":"1822","DOI":"10.1016\/j.microrel.2012.06.092","article-title":"Design of CMOSlogic gates with enhanced robustness against aging","volume":"52","author":"butzen","year":"2012","journal-title":"Degradation Microelectronics Reliability"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2009.2030113"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.844302"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1002\/0471723703"},{"key":"9","article-title":"General strategies to design nanometer flip-flops in theenergy-delay space","author":"alioto","year":"2010","journal-title":"IEEE TCAD"},{"key":"8","doi-asserted-by":"crossref","first-page":"1392","DOI":"10.1109\/JSSC.2007.896516","article-title":"The effect of the systemspecification on the optimal selection of clocked storage elements","volume":"42","author":"giacomotto","year":"2007","journal-title":"IEEEJ Solid State Circuits"}],"event":{"name":"2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI)","start":{"date-parts":[[2013,9,2]]},"location":"Curitiba, Brazil","end":{"date-parts":[[2013,9,6]]}},"container-title":["2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6634599\/6644849\/06644860.pdf?arnumber=6644860","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T01:07:35Z","timestamp":1498093655000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6644860\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/sbcci.2013.6644860","relation":{},"subject":[],"published":{"date-parts":[[2013,9]]}}}