{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T07:21:08Z","timestamp":1725434468899},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,8]]},"DOI":"10.1109\/sbcci.2016.7724047","type":"proceedings-article","created":{"date-parts":[[2016,11,2]],"date-time":"2016-11-02T19:26:19Z","timestamp":1478114779000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Design and analysis of the HF-RISC processor targeting voltage scaling applications"],"prefix":"10.1109","author":[{"given":"Felipe Todeschini","family":"Bortolon","sequence":"first","affiliation":[]},{"given":"Sergio Johann","family":"Filho","sequence":"additional","affiliation":[]},{"given":"Matheus","family":"Gibiluka","sequence":"additional","affiliation":[]},{"given":"Sergio","family":"Bampi","sequence":"additional","affiliation":[]},{"given":"Ney Laert Vilar","family":"Calazans","sequence":"additional","affiliation":[]},{"given":"Fabiano Passuelo","family":"Hessel","sequence":"additional","affiliation":[]},{"given":"Matheus Trevisan","family":"Moreira","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"868","article-title":"Theoretical and practical limits of dynamic voltage scaling","author":"bo zhai","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/S3S.2015.7333526"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746341"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2285384"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2220671"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2012.6176932"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-68402-9_37"},{"key":"ref17","first-page":"3","article-title":"Circuit design in nanoscale fdsoi technologies","author":"nikoli","year":"2014","journal-title":"Proc 29th Intern Conf Microelectron"},{"key":"ref18","first-page":"318","article-title":"A 65nm Sub- Vt Microcontroller with Integrated SRAM and Switched-Capacitor DC-DC Converter","author":"kwong","year":"2008","journal-title":"IEEE InternationalSolid-State Circuits Conference Digest of Technical Papers"},{"key":"ref19","first-page":"16","article-title":"A standard cell characterization flow for non-standard voltage supplies","year":"2016","journal-title":"27th Symposium on Integrated Circuits and Systems Design (SBCCI)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1815961.1815967"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1294313.1294319"},{"journal-title":"Tech Rep","article-title":"Cortex-mfl+ technical reference manual","year":"2012","key":"ref6"},{"key":"ref5","article-title":"The HF-RISC Processor: Performance Assessment","author":"filho","year":"2016","journal-title":"LASCAS"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/344166.344181"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/1165573.1165578"},{"article-title":"The Definitive Guide to the ARM Cortex-MO","year":"2011","author":"yiu","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.future.2013.01.010"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.852658"},{"article-title":"Analysis of Voltage Scaling Effects in the Design of Resilient Circuits","year":"2016","author":"gibiluka","key":"ref20"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/2800986.2801004"}],"event":{"name":"2016 29th Symposium on Integrated Circuits and Systems Design (SBCCI)","start":{"date-parts":[[2016,8,29]]},"location":"Belo Horizonte, Brazil","end":{"date-parts":[[2016,9,3]]}},"container-title":["2016 29th Symposium on Integrated Circuits and Systems Design (SBCCI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7593174\/7724036\/07724047.pdf?arnumber=7724047","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,11,23]],"date-time":"2016-11-23T07:30:32Z","timestamp":1479886232000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7724047\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,8]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/sbcci.2016.7724047","relation":{},"subject":[],"published":{"date-parts":[[2016,8]]}}}