{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,20]],"date-time":"2026-05-20T16:10:19Z","timestamp":1779293419115,"version":"3.51.4"},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,8,25]],"date-time":"2025-08-25T00:00:00Z","timestamp":1756080000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,8,25]],"date-time":"2025-08-25T00:00:00Z","timestamp":1756080000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,8,25]]},"DOI":"10.1109\/sbcci66862.2025.11218640","type":"proceedings-article","created":{"date-parts":[[2025,10,31]],"date-time":"2025-10-31T17:10:05Z","timestamp":1761930605000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Auto-Tuning Aging Sensor Validated Under Burn-In, Temperature, and Voltage Variations"],"prefix":"10.1109","author":[{"given":"Lucas","family":"Nogueira","sequence":"first","affiliation":[{"name":"Universidade Federal do Ceará,Fortaleza,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F","family":"Mirailton","sequence":"additional","affiliation":[{"name":"Universidade Federal do Ceará,Fortaleza,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Danilo","family":"Alencar","sequence":"additional","affiliation":[{"name":"Universidade Federal do Ceará,Fortaleza,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J","family":"Alisson","sequence":"additional","affiliation":[{"name":"Universidade Federal do Ceará,Fortaleza,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jardel","family":"Silveira","sequence":"additional","affiliation":[{"name":"Universidade Federal do Ceará,Fortaleza,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jarbas","family":"Silveira","sequence":"additional","affiliation":[{"name":"Universidade Federal do Ceará,Fortaleza,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fabian","family":"Vargas","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3695247"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2016.2622688"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/fpl.2012.6339194"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/iolts60994.2024.10616091"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tnano.2013.2253795"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2016.2523458"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/test.1995.529816"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/23.273553"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/aspdac.2009.4796528"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tetc.2017.2771441"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/vts.2007.22"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/lats65346.2025.10963953"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/mm.2004.85"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/fpl.2014.6927390"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2020.3023684"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/fpl50879.2020.00037"},{"key":"ref17","article-title":"MIL-STD-883, Method 1015.50: Burn-In Test","year":"2016"},{"key":"ref18","article-title":"Jedec standard no. 22-a108d: Temperature, bias, and operating life","year":"2022"},{"key":"ref19","article-title":"Mil-std-883, method 1005.9: Steady-state life","year":"2010"},{"key":"ref20","volume-title":"7 Series FPGAs Clocking Resources User Guide","year":"2023"},{"key":"ref21","volume-title":"7 Series FPGAs and Zynq-7000 SoC XADC User Guide, AMD, 2023, user Guide UG480","year":"2023"},{"key":"ref22","volume-title":"Artix-7 FPGA Data Sheet: DC and AC Switching Characteristics","year":"2023"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-012-5297-0"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tetc.2022.3147376"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/lats62223.2024.10534625"}],"event":{"name":"2025 38th SBC\/SBMicro\/IEEE Symposium on Integrated Circuits and Systems Design (SBCCI)","location":"Manaus, Brazil","start":{"date-parts":[[2025,8,25]]},"end":{"date-parts":[[2025,9,1]]}},"container-title":["2025 38th SBC\/SBMicro\/IEEE Symposium on Integrated Circuits and Systems Design (SBCCI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11218269\/11218272\/11218640.pdf?arnumber=11218640","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T06:29:40Z","timestamp":1761978580000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11218640\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8,25]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/sbcci66862.2025.11218640","relation":{},"subject":[],"published":{"date-parts":[[2025,8,25]]}}}