{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T01:10:03Z","timestamp":1755911403017,"version":"3.44.0"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/sensors43011.2019.8956620","type":"proceedings-article","created":{"date-parts":[[2020,1,15]],"date-time":"2020-01-15T03:50:51Z","timestamp":1579060251000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["Gamma-induced Degradation Analysis of Commercial off-the-shelf Camera Sensors"],"prefix":"10.1109","author":[{"given":"Bilal","family":"Aslam","sequence":"first","affiliation":[{"name":"University of Essex,Embedded and Intelligent Systems Lab,Colchester,CO4 3SQ"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sangeet","family":"Saha","sequence":"additional","affiliation":[{"name":"University of Essex,Embedded and Intelligent Systems Lab,Colchester,CO4 3SQ"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zeba","family":"Khanam","sequence":"additional","affiliation":[{"name":"University of Essex,Embedded and Intelligent Systems Lab,Colchester,CO4 3SQ"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaojun","family":"Zhai","sequence":"additional","affiliation":[{"name":"University of Essex,Embedded and Intelligent Systems Lab,Colchester,CO4 3SQ"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shoaib","family":"Ehsan","sequence":"additional","affiliation":[{"name":"University of Essex,Embedded and Intelligent Systems Lab,Colchester,CO4 3SQ"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rustam","family":"Stolkin","sequence":"additional","affiliation":[{"name":"University of Birmingham,Extreme Robotics Lab (ERL),Birmingham,B15 2TT"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Klaus","family":"McDonald-Maier","sequence":"additional","affiliation":[{"name":"University of Essex,Embedded and Intelligent Systems Lab,Colchester,CO4 3SQ"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"year":"0","key":"ref10","article-title":"Raspberry pi camera"},{"year":"0","key":"ref11","article-title":"Trust usb camera"},{"year":"0","key":"ref12","article-title":"Spy camera"},{"key":"ref13","first-page":"29","article-title":"Emva standard 1288, standard for characterization of image sensors and cameras","volume":"3","author":"association","year":"2010","journal-title":"Release"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2765481"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2490479"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.4889878"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2368139"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2369436"},{"key":"ref7","first-page":"1039007","article-title":"Radiation effects on active camera electronics in the target chamber at the national ignition facility","author":"dayton","year":"2017","journal-title":"Target Diagnostics Physics and Engineering for Inertial Confinement Fusion VI"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2018.2884037"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/SSRR.2011.6106756"},{"year":"0","key":"ref9","article-title":"Dalton Cumbrian facility"}],"event":{"name":"2019 IEEE SENSORS","start":{"date-parts":[[2019,10,27]]},"location":"Montreal, QC, Canada","end":{"date-parts":[[2019,10,30]]}},"container-title":["2019 IEEE SENSORS"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8949872\/8956486\/08956620.pdf?arnumber=8956620","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T00:43:52Z","timestamp":1755909832000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8956620\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/sensors43011.2019.8956620","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}