{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T19:14:19Z","timestamp":1754162059592,"version":"3.41.2"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/sensors43011.2019.8956836","type":"proceedings-article","created":{"date-parts":[[2020,1,15]],"date-time":"2020-01-15T03:50:51Z","timestamp":1579060251000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["In-Situ Semiconductor Position Sensor for Differentially Piezo-Driven Nanopositioners"],"prefix":"10.1109","author":[{"given":"Ali","family":"Bazaei","sequence":"first","affiliation":[{"name":"Institut des Syst&#x00E8;mes Intelligents et de Robotique, UMR 7222, ISIR,Sorbonne Universit&#x00E9;, Campus Pierre et Marie Curie,Paris,France,F-75005"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mokrane","family":"Boudaoud","sequence":"additional","affiliation":[{"name":"Institut des Syst&#x00E8;mes Intelligents et de Robotique, UMR 7222, ISIR,Sorbonne Universit&#x00E9;, Campus Pierre et Marie Curie,Paris,France,F-75005"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Massoud Hemmasian","family":"Ettefagh","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology,School of Automation,Wuhan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhiyong","family":"Chen","sequence":"additional","affiliation":[{"name":"University of Newcastle Australia,School of Electrical Engineering and Computing,NSW,2308"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stephane","family":"R\u00e9gnier","sequence":"additional","affiliation":[{"name":"Institut des Syst&#x00E8;mes Intelligents et de Robotique, UMR 7222, ISIR,Sorbonne Universit&#x00E9;, Campus Pierre et Marie Curie,Paris,France,F-75005"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"106","DOI":"10.1016\/j.sna.2012.10.016","article-title":"A review of nanometer resolution position sensors: operation and performance","volume":"190","author":"fleming","year":"2013","journal-title":"Sensors and Actuators A Physical"},{"year":"0","key":"ref11"},{"year":"0","key":"ref12"},{"year":"0","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/s120709697"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.41.6283"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2010.04.008"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2016.06.042"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2923428"},{"year":"0","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/mnl:20065075"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1177\/1045389X04044450"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.4848876"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2010.2052107"},{"key":"ref8","first-page":"116","article-title":"A survey of eddy current displacement sensors: Imperfections and signal conditioning methods","author":"nabavi","year":"2007","journal-title":"16th International Scientific and Applied Science Conference Book 3 Electronics ET 2007"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/computers7010010"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/23\/7\/074012"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2007.902953"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2012.2204321"},{"year":"0","key":"ref20"}],"event":{"name":"2019 IEEE SENSORS","start":{"date-parts":[[2019,10,27]]},"location":"Montreal, QC, Canada","end":{"date-parts":[[2019,10,30]]}},"container-title":["2019 IEEE SENSORS"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8949872\/8956486\/08956836.pdf?arnumber=8956836","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,29]],"date-time":"2025-07-29T18:23:47Z","timestamp":1753813427000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8956836\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/sensors43011.2019.8956836","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}