{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:03:37Z","timestamp":1740099817683,"version":"3.37.3"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,10,25]],"date-time":"2020-10-25T00:00:00Z","timestamp":1603584000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,10,25]],"date-time":"2020-10-25T00:00:00Z","timestamp":1603584000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,10,25]],"date-time":"2020-10-25T00:00:00Z","timestamp":1603584000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100008530","name":"European Regional Development Fund","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100008530","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,10,25]]},"DOI":"10.1109\/sensors47125.2020.9278716","type":"proceedings-article","created":{"date-parts":[[2020,12,10]],"date-time":"2020-12-10T03:29:29Z","timestamp":1607570969000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Micrometer-thin SOI Sensors for E-Skin Applications"],"prefix":"10.1109","author":[{"given":"Wei","family":"Peng","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nicolas","family":"Andre","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xi","family":"Zeng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Iman Sabri","family":"Alirezaei","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guoli","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohamed","family":"Bouterfa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Laurent","family":"Francis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Denis","family":"Flandre","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1021\/nl503997m"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/advs.201500169"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"4","DOI":"10.1016\/j.nima.2013.05.139","article-title":"Charge collection mapping of a novel ultra-thin silicon strip detector for hadron therapy beam monitoring","volume":"732","author":"bouterfa","year":"2013","journal-title":"Nuclear Instruments and Methods in Physics Research A"},{"key":"ref6","article-title":"Ultra-low-power 130nm SOI CMOS smart sensor for in-situ mechanical stress in SiP and SoC applications","author":"al kadi jazairli","year":"2016","journal-title":"14th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics (IRSP 2016) Bad Schandau"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2015.04.022"},{"key":"ref5","first-page":"695","article-title":"Studies of Thermal Injury II. The relative importance of time and surface temperature in the causation of cutaneous burns","author":"moritz","year":"1947","journal-title":"Am J Pathol"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2694393"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2930244"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2013.03.013"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ab12b8"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/technologies7020035"}],"event":{"name":"2020 IEEE SENSORS","start":{"date-parts":[[2020,10,25]]},"location":"Rotterdam, Netherlands","end":{"date-parts":[[2020,10,28]]}},"container-title":["2020 IEEE SENSORS"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9278450\/9278578\/09278716.pdf?arnumber=9278716","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T15:14:56Z","timestamp":1656602096000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9278716\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,10,25]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/sensors47125.2020.9278716","relation":{},"subject":[],"published":{"date-parts":[[2020,10,25]]}}}