{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,8]],"date-time":"2026-04-08T16:29:31Z","timestamp":1775665771372,"version":"3.50.1"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,29]],"date-time":"2023-10-29T00:00:00Z","timestamp":1698537600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,29]],"date-time":"2023-10-29T00:00:00Z","timestamp":1698537600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,29]]},"DOI":"10.1109\/sensors56945.2023.10324885","type":"proceedings-article","created":{"date-parts":[[2023,11,28]],"date-time":"2023-11-28T14:02:53Z","timestamp":1701180173000},"page":"1-4","source":"Crossref","is-referenced-by-count":11,"title":["Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor"],"prefix":"10.1109","author":[{"given":"Navneet","family":"Gandhi","sequence":"first","affiliation":[{"name":"PDPM- IIITDM,VLSI Lab,Electronics & Communication Department,Jabalpur,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rajeewa Kumar","family":"Jaisawal","sequence":"additional","affiliation":[{"name":"PDPM- IIITDM,VLSI Lab,Electronics & Communication Department,Jabalpur,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sunil","family":"Rathore","sequence":"additional","affiliation":[{"name":"PDPM- IIITDM,VLSI Lab,Electronics & Communication Department,Jabalpur,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P. N.","family":"Kondekar","sequence":"additional","affiliation":[{"name":"PDPM- IIITDM,VLSI Lab,Electronics & Communication Department,Jabalpur,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ankit","family":"Dixit","sequence":"additional","affiliation":[{"name":"University of Glasgow,United Kingdom"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Navneen","family":"Kumar","sequence":"additional","affiliation":[{"name":"University of Glasgow,United Kingdom"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vihar","family":"Georgiev","sequence":"additional","affiliation":[{"name":"University of Glasgow,United Kingdom"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Navjeet","family":"Bagga","sequence":"additional","affiliation":[{"name":"School of Electrical Sciences, Indian Institute of Technology,Bhubaneswar,India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s12633-021-01392-x"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tnano.2023.3308814"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/lsens.2023.3309263"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/9781119523543"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1143\/jjap.49.024206"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-4247(01)00672-0"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.4775358"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.88053"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2019.2903216"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1021\/ar970068s"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/led.2013.2264824"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2023.3241884"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tnano.2013.2276394"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2021.3067801"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2021.3072476"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/16.141236"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/led.2011.2158978"}],"event":{"name":"2023 IEEE SENSORS","location":"Vienna, Austria","start":{"date-parts":[[2023,10,29]]},"end":{"date-parts":[[2023,11,1]]}},"container-title":["2023 IEEE SENSORS"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10324456\/10324848\/10324885.pdf?arnumber=10324885","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T17:05:33Z","timestamp":1761066333000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10324885\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,29]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/sensors56945.2023.10324885","relation":{},"subject":[],"published":{"date-parts":[[2023,10,29]]}}}