{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,22]],"date-time":"2025-10-22T19:51:32Z","timestamp":1761162692307,"version":"build-2065373602"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,29]],"date-time":"2023-10-29T00:00:00Z","timestamp":1698537600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,29]],"date-time":"2023-10-29T00:00:00Z","timestamp":1698537600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,29]]},"DOI":"10.1109\/sensors56945.2023.10325247","type":"proceedings-article","created":{"date-parts":[[2023,11,28]],"date-time":"2023-11-28T14:02:53Z","timestamp":1701180173000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Neural Networks for Defect Detection on Eddy-Currents-Based Non-Destructive Testing"],"prefix":"10.1109","author":[{"given":"Diogo M.","family":"Caetano","sequence":"first","affiliation":[{"name":"INESC Microsistemas e Nanotecnologias,Lisbon,Portugal,1000\u2013029"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luis S.","family":"Rosado","sequence":"additional","affiliation":[{"name":"Instituto Superior T&#x00E9;cnico,Lisbon,Portugal,1049-001"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jorge R.","family":"Fernandes","sequence":"additional","affiliation":[{"name":"INESC Investiga&#x00E7;&#x00E3;o e Desenvolvimento,Lisbon,Portugal,1000-029"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Susana","family":"Cardoso","sequence":"additional","affiliation":[{"name":"INESC Microsistemas e Nanotecnologias,Lisbon,Portugal,1000\u2013029"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"article-title":"Eddy current probes based on mag-netoresistive array sensors as receivers","volume-title":"Proc.19th World Conference on Non-Destructive Testing 2016","author":"Sergeeva-Chollet","key":"ref1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2636807"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2015.7169039"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2010.5488183"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2879306"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/s120912169"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2326959"},{"issue":"16","key":"ref8","first-page":"165221","article-title":"Magnetoresistive Sensors","volume-title":"Journal of Physics: Condensed Matter","volume":"19","author":"Freitas","year":"2007"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-53107-6"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/BioCAS.2012.6418507"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1142\/S2010324711000070"},{"article-title":"MR-based eddy current probe design for hidden defects detection","volume-title":"Proc. of European Conference on Non-Destructive Testing (ECNDT)","author":"Pelkner","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3244208"},{"volume-title":"Method of detection and classification of non-periodic signals and the respective system that implements it","year":"2019","author":"Caetano","key":"ref14"},{"article-title":"Adam: A method for stochastic optimization","volume-title":"International Conference on Learning Representations","author":"Kingma","key":"ref15"},{"key":"ref16","first-page":"351","article-title":"Pulsed Eddy Currents Testing Using a Planar Matrix Probe","volume-title":"Measurement","volume":"77","author":"Abrantes","year":"2016"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2012.6229696"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2014.03.021"},{"key":"ref19","first-page":"359","article-title":"Advances in ndt and materials characterization by eddy currents","volume-title":"Procedia CIRP","volume":"7","author":"Almeida","year":"2013"}],"event":{"name":"2023 IEEE SENSORS","start":{"date-parts":[[2023,10,29]]},"location":"Vienna, Austria","end":{"date-parts":[[2023,11,1]]}},"container-title":["2023 IEEE SENSORS"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10324456\/10324848\/10325247.pdf?arnumber=10325247","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T17:05:26Z","timestamp":1761066326000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10325247\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,29]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/sensors56945.2023.10325247","relation":{},"subject":[],"published":{"date-parts":[[2023,10,29]]}}}