{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,17]],"date-time":"2025-12-17T17:44:51Z","timestamp":1765993491447,"version":"3.37.3"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,20]],"date-time":"2024-10-20T00:00:00Z","timestamp":1729382400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,20]],"date-time":"2024-10-20T00:00:00Z","timestamp":1729382400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100010097","name":"China Association for Science and Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100010097","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,20]]},"DOI":"10.1109\/sensors60989.2024.10784769","type":"proceedings-article","created":{"date-parts":[[2024,12,17]],"date-time":"2024-12-17T19:07:24Z","timestamp":1734462444000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["A Flexible Capacitive Pressure Sensor with Improved Sensitivity Over a Broad Pressure Range"],"prefix":"10.1109","author":[{"given":"Chunyu","family":"Lv","sequence":"first","affiliation":[{"name":"College of Precision Instrument and Opto-electronics Engineering, Tianjin University,State Key Laboratory of Precision Measuring Technology and Instrument,Tianjin,China,300072"}]},{"given":"Siyi","family":"Wei","sequence":"additional","affiliation":[{"name":"College of Precision Instrument and Opto-electronics Engineering, Tianjin University,State Key Laboratory of Precision Measuring Technology and Instrument,Tianjin,China,300072"}]},{"given":"Ye","family":"Li","sequence":"additional","affiliation":[{"name":"College of Precision Instrument and Opto-electronics Engineering, Tianjin University,State Key Laboratory of Precision Measuring Technology and Instrument,Tianjin,China,300072"}]},{"given":"Tao","family":"Lv","sequence":"additional","affiliation":[{"name":"College of Precision Instrument and Opto-electronics Engineering, Tianjin University,State Key Laboratory of Precision Measuring Technology and Instrument,Tianjin,China,300072"}]},{"given":"Qi","family":"Li","sequence":"additional","affiliation":[{"name":"College of Precision Instrument and Opto-electronics Engineering, Tianjin University,State Key Laboratory of Precision Measuring Technology and Instrument,Tianjin,China,300072"}]},{"given":"Yang","family":"Liu","sequence":"additional","affiliation":[{"name":"College of Precision Instrument and Opto-electronics Engineering, Tianjin University,State Key Laboratory of Precision Measuring Technology and Instrument,Tianjin,China,300072"}]},{"given":"Mengying","family":"Xie","sequence":"additional","affiliation":[{"name":"College of Precision Instrument and Opto-electronics Engineering, Tianjin University,State Key Laboratory of Precision Measuring Technology and Instrument,Tianjin,China,300072"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/admt.202201959"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1039\/d2na00866a"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/advs.202206807"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3369850"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.cej.2024.149926"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.compscitech.2023.110166"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JFLEX.2023.3264190"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.2c21885"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202103320"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/admt.202200609"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2023.115449"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.1955.0005"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1017\/cbo9780511709340"},{"key":"ref14","first-page":"271","article-title":"Fine particles, thin films and exchange anisotropy","volume-title":"Magnetism","volume":"III","author":"Jacobs","year":"1963"},{"volume-title":"Title of paper if known","author":"Elissa","key":"ref15"},{"journal-title":"J. Name Stand. Abbrev.","article-title":"Title of paper with only first word capitalized","author":"Nicole","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TJMJ.1987.4549593"},{"volume-title":"The Technical Writer\u2019s Handbook","year":"1989","author":"Young","key":"ref18"}],"event":{"name":"2024 IEEE SENSORS","start":{"date-parts":[[2024,10,20]]},"location":"Kobe, Japan","end":{"date-parts":[[2024,10,23]]}},"container-title":["2024 IEEE SENSORS"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10783834\/10784457\/10784769.pdf?arnumber=10784769","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,15]],"date-time":"2025-01-15T19:26:43Z","timestamp":1736969203000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10784769\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,20]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/sensors60989.2024.10784769","relation":{},"subject":[],"published":{"date-parts":[[2024,10,20]]}}}