{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T09:32:39Z","timestamp":1729675959523,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,7]]},"DOI":"10.1109\/sies.2007.4297319","type":"proceedings-article","created":{"date-parts":[[2007,9,6]],"date-time":"2007-09-06T20:58:04Z","timestamp":1189112284000},"page":"71-77","source":"Crossref","is-referenced-by-count":0,"title":["Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems"],"prefix":"10.1109","author":[{"given":"Gert","family":"Jervan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Helena","family":"Kruus","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Elmet","family":"Orasson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Raimund","family":"Ubar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556960"},{"key":"ref11","first-page":"237","article-title":"LFSR-Coded Test Patterns for Scan Designs","author":"koenemann","year":"1991","journal-title":"European Test Conference"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"134","DOI":"10.1145\/343647.343719","article-title":"Analysis and Minimization of Test Time in a Combined BIST and External Test Approach","author":"sugihara","year":"2000","journal-title":"Design Automation and Test in Europe Conference (DATE)"},{"key":"ref13","first-page":"120","article-title":"Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers","author":"hellebrand","year":"1992","journal-title":"International Test Conference (ITC)"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529897"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.837985"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250116"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s11390-006-0907-x"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2005.16"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/BEC.2006.311097"},{"key":"ref4","first-page":"46","article-title":"Multichip Module Self-Test Provides Means to Test at Speed","volume":"9","author":"flint","year":"1995","journal-title":"EE-Evaluation Engineering"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/35.769283"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2002.996750"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511816321"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510828"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2000.887168"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743146"},{"journal-title":"Semiconductor Industry Association","article-title":"The International Technology Roadmap for Semiconductors","year":"2005","key":"ref1"},{"key":"ref9","first-page":"144","article-title":"BETSY: Synthesizing Circuits for a Specified BIST","author":"zhao","year":"1998","journal-title":"International Test Conference (ITC)"},{"journal-title":"Tallinn University of Technology","article-title":"Turbo Tester Reference Manual. Version 3.2002.10","year":"2002","key":"ref20"}],"event":{"name":"2007 International Symposium on Industrial Embedded Systems","start":{"date-parts":[[2007,7,4]]},"location":"Costa da Caparica, Portugal","end":{"date-parts":[[2007,7,6]]}},"container-title":["2007 International Symposium on Industrial Embedded Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4297296\/4297297\/04297319.pdf?arnumber=4297319","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,2]],"date-time":"2019-05-02T21:39:56Z","timestamp":1556833196000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4297319\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,7]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/sies.2007.4297319","relation":{},"subject":[],"published":{"date-parts":[[2007,7]]}}}