{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,18]],"date-time":"2026-10-18T06:14:30Z","timestamp":1792304070554,"version":"4.4.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,1]]},"DOI":"10.1109\/sii.2019.8700372","type":"proceedings-article","created":{"date-parts":[[2019,4,30]],"date-time":"2019-04-30T06:34:08Z","timestamp":1556606048000},"page":"566-571","source":"Crossref","is-referenced-by-count":6,"title":["Digitalized Ultrasonic Inspection By Optical Tracking"],"prefix":"10.1109","author":[{"given":"Robert H.","family":"Schmitt","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Philipp","family":"Nienheysen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nico","family":"Lehmann","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hamid","family":"Jahangir","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Martin","family":"Peterek","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Thomas","family":"Neuenhahn","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.5220\/0005267104620471"},{"key":"ref11","article-title":"System zur Positions-und Lagebestimmung von Objekten","volume":"20","author":"gietzen","year":"2017","journal-title":"Protection Law DE 102015013551A1"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-32836-2"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-10680-8"},{"key":"ref14","year":"2018","journal-title":"Nexonar IR Single Camera Field of View"},{"key":"ref15","article-title":"Moving average and Savitzki-Golay smoothing filters using Mathcad","author":"guinon","year":"2007","journal-title":"International Conference on Engineering Education"},{"key":"ref16","author":"bernardin","year":"1993","journal-title":"C\/Math Toolchest For Engineering and Scientific Applications"},{"key":"ref17","year":"2018","journal-title":"The University of UTAH&#x00AE; James C Sutherland &#x2013; CHEN 2450 Interpolation"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/S0041-624X(99)00082-7"},{"key":"ref19","author":"osman","year":"2013","journal-title":"Automated Evaluation of Three Dimensional Ultrasonic Datasets"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-02895-8_31"},{"key":"ref3","year":"2018","journal-title":"Olympus IMS Industrial Scanners"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.5772\/8678"},{"key":"ref5","article-title":"Robotic non-destructive inspection","author":"mineo","year":"2013","journal-title":"Proceedings of 51st Annual Conference of the British Institute of Non-Destructive Testing 2012"},{"key":"ref8","article-title":"C-Scan Ultrasonic Generation using Wireless Encoder based on Passive Makers","author":"lasagni","year":"2014","journal-title":"International Symposium on NDT in Aerospace"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1561\/0600000001"},{"key":"ref2","year":"2018","journal-title":"Bundesverband der Deutschen Gie&#x00DF;erei-Industrie (BDG) Stahlguss"},{"key":"ref1","year":"2014","journal-title":"Non-destructive testing &#x2013; Ultrasonic testing &#x2013; Characterization and sizing of discontinuities"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1108\/IR-09-2014-0386"}],"event":{"name":"2019 IEEE\/SICE International Symposium on System Integration (SII)","location":"Paris, France","start":{"date-parts":[[2019,1,14]]},"end":{"date-parts":[[2019,1,16]]}},"container-title":["2019 IEEE\/SICE International Symposium on System Integration (SII)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8694892\/8700325\/08700372.pdf?arnumber=8700372","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T17:51:08Z","timestamp":1658080268000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8700372\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,1]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/sii.2019.8700372","relation":{},"subject":[],"published":{"date-parts":[[2019,1]]}}}