{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T13:51:30Z","timestamp":1730296290940,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,1,17]],"date-time":"2023-01-17T00:00:00Z","timestamp":1673913600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,17]],"date-time":"2023-01-17T00:00:00Z","timestamp":1673913600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,1,17]]},"DOI":"10.1109\/sii55687.2023.10039109","type":"proceedings-article","created":{"date-parts":[[2023,2,16]],"date-time":"2023-02-16T21:26:35Z","timestamp":1676582795000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Camera-based Progress Estimation of Assembly Work Using Deep Metric Learning"],"prefix":"10.1109","author":[{"given":"Takumi","family":"Kitsukawa","sequence":"first","affiliation":[{"name":"The Course of Precision Engineering, School of Science and Engineering, Chuo University,Tokyo,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sarthak","family":"Pathak","sequence":"additional","affiliation":[{"name":"The Course of Precision Engineering, School of Science and Engineering, Chuo University,Tokyo,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alessandro","family":"Moro","sequence":"additional","affiliation":[{"name":"The Course of Precision Engineering, School of Science and Engineering, Chuo University,Tokyo,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yoshihiro","family":"Harada","sequence":"additional","affiliation":[{"name":"Hitachi High-Tech Solutions Corporation,Tokyo,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hideo","family":"Nishikawa","sequence":"additional","affiliation":[{"name":"Hitachi High-Tech Solutions Corporation,Tokyo,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Minori","family":"Noguchi","sequence":"additional","affiliation":[{"name":"Hitachi High-Tech Solutions Corporation,Tokyo,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Akifumi","family":"Hamaya","sequence":"additional","affiliation":[{"name":"Hitachi High-Tech Solutions Corporation,Tokyo,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kazunori","family":"Umeda","sequence":"additional","affiliation":[{"name":"The Course of Precision Engineering, School of Science and Engineering, Chuo University,Tokyo,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s40684-016-0015-5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2018.01.003"},{"volume-title":"Ensuring consistent product quality and improving productivity by work-video analysis and data visualization of the results","year":"2022","author":"Hitachi","key":"ref3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3056540.3056548"},{"key":"ref5","article-title":"Distance Metric Learning with Application to Clustering with Side-Information","volume-title":"Neural Information Processing Systems (NIPS)","author":"Xing","year":"2002"},{"key":"ref6","article-title":"Distance Metric Learning for Large Margin Nearest Neighbor Classification","volume-title":"Neural Information Processing Systems (NIPS)","author":"Weinberger","year":"2005"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2017.2732900"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24261-3_7"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2016.2577031"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00142"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/SII52469.2022.9708838"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.81"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.169"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00935"},{"volume-title":"Network Camera Qwatch TS-WRLP","year":"2022","key":"ref15"},{"key":"ref16","first-page":"2579","article-title":"Visualizing Data using t-SNE","volume":"9","author":"Van Der Maaten","year":"2008","journal-title":"Journal of Machine Learning Research"},{"volume-title":"Detectron2","year":"2022","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-10602-1_48"}],"event":{"name":"2023 IEEE\/SICE International Symposium on System Integration (SII)","start":{"date-parts":[[2023,1,17]]},"location":"Atlanta, GA, USA","end":{"date-parts":[[2023,1,20]]}},"container-title":["2023 IEEE\/SICE International Symposium on System Integration (SII)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10038976\/10039084\/10039109.pdf?arnumber=10039109","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T14:13:40Z","timestamp":1707833620000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10039109\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,1,17]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/sii55687.2023.10039109","relation":{},"subject":[],"published":{"date-parts":[[2023,1,17]]}}}