{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T21:45:09Z","timestamp":1775339109673,"version":"3.50.1"},"reference-count":12,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/sisw.2002.1183512","type":"proceedings-article","created":{"date-parts":[[2003,8,27]],"date-time":"2003-08-27T11:38:00Z","timestamp":1061984280000},"page":"65-69","source":"Crossref","is-referenced-by-count":28,"title":["On a new way to read data from memory"],"prefix":"10.1109","author":[{"given":"D.","family":"Sanlyde","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Skorobogatov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Anderson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.-J.","family":"Quisquater","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","article-title":"The EM Side-channel(s)","author":"agrawal","year":"2002","journal-title":"Cryptographic Hardware and Embedded Systems"},{"key":"ref3","article-title":"Low temperature data remanence in static RAM","author":"skorobogatov","year":"2002","journal-title":"Technical report UCAM-C L-TR-536"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ASYNC.2002.1000311"},{"key":"ref6","first-page":"1","article-title":"Tamper Resistance - a Cautionary Note","author":"anderson","year":"0","journal-title":"Proceedings of the Second Usenix Workshop on Electronic Commerce"},{"key":"ref11","article-title":"Anti Tamper Encapsulation for an Integrated Circuit","volume":"1","author":"k\u00f6mmerling","year":"2001","journal-title":"patent application PCT WO 01\/50530 A"},{"key":"ref5","first-page":"185","article-title":"Eddy Current for Magnetic Analysis with Active Sensor","author":"quisquater","year":"2002","journal-title":"Proc Esmart"},{"key":"ref12","article-title":"Balanced Self-Checking Asynchronous Logic for Smartcard Applications","author":"moore","year":"0","journal-title":"Journal of Microprocessors and Microsystems"},{"key":"ref8","first-page":"37","article-title":"Two New Imaging Techniques Promise To Improve IC Defect Identification","volume":"43","author":"ajluni","year":"1995","journal-title":"Electronic Design"},{"key":"ref7","article-title":"Design Principles for Tamper-Resistant Security Processors","author":"k\u00f6mmerling","year":"1999","journal-title":"USENIX Workshop on Smartcard Technology"},{"key":"ref2","article-title":"Data Remanence in Semiconductor Devices","author":"gutmann","year":"2001","journal-title":"10th USENIX security symposium"},{"key":"ref9","first-page":"388","article-title":"Advances in Cryptology - CRYPTO'99","volume":"1666","author":"kocher","year":"1999","journal-title":"Differential power analysis"},{"key":"ref1","article-title":"Optical Fault Induction Attacks","author":"skorobogatov","year":"2002","journal-title":"Cryptographic Hardware and Embedded Systems"}],"event":{"name":"First International IEEE Security in Storage Workshop","location":"Greenbelt, MD, USA","acronym":"SISW-02"},"container-title":["First International IEEE Security in Storage Workshop, 2002. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8432\/26556\/01183512.pdf?arnumber=1183512","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T19:44:16Z","timestamp":1489434256000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1183512\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/sisw.2002.1183512","relation":{},"subject":[]}}