{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T13:56:07Z","timestamp":1730296567493,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1109\/sisy.2015.7325368","type":"proceedings-article","created":{"date-parts":[[2015,11,12]],"date-time":"2015-11-12T18:09:14Z","timestamp":1447351754000},"page":"145-148","source":"Crossref","is-referenced-by-count":1,"title":["Calibration system for tactile measuring probes"],"prefix":"10.1109","author":[{"given":"Gy.","family":"Hermann","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I.","family":"Rudas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Miniaturinterferometer mit Planspiegel-reflektor","year":"1998","key":"ref10"},{"journal-title":"Prazisions Prüfgerät für Nanomess-tasters","year":"2003","author":"wang","key":"ref11"},{"journal-title":"Laser based displacement calibration with nanometer accuracy","year":"1998","author":"wetzels","key":"ref12"},{"key":"ref13","first-page":"139","article-title":"Design and Implementation of Differential Evolution Algorithm on FPGA for Double-Precision Floating-Point Representation","volume":"11","author":"cort\u00e9s-antonio","year":"2014","journal-title":"Acta Polytechnica Hungarica"},{"key":"ref4","article-title":"Laser Interference N ano-Comparator for Length Sensor Calibration","author":"cip","year":"0","journal-title":"Nanometric Scale NANOCON 2010 Olomouc Czech Republic"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/0141-6359(79)90037-0"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/9\/7\/016"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0141-6359(96)00039-6"},{"journal-title":"ISO Guide to the Expression of Uncertainty in Measurement","year":"0","key":"ref8"},{"key":"ref7","first-page":"111","article-title":"Design of a calibration system for measuring probes","volume":"4","author":"hermann","year":"2007","journal-title":"Acta Polytechnica Hungarica"},{"journal-title":"Ontwerp Van Een Kalibratieopstelling Voor Lineaire Meetsystemen Tot 300 mm","year":"0","author":"bos","key":"ref2"},{"key":"ref1","first-page":"7","author":"bos","year":"0","journal-title":"A Calibration Setup for a New Type of Nano Probe"},{"key":"ref9","article-title":"A novel 3D CMM Probe Calibration Facility","author":"leach","year":"1995","journal-title":"National Physical Laboratory"}],"event":{"name":"2015 IEEE 13th International Symposium on Intelligent Systems and Informatics (SISY)","start":{"date-parts":[[2015,9,17]]},"location":"Subotica, Serbia","end":{"date-parts":[[2015,9,19]]}},"container-title":["2015 IEEE 13th International Symposium on Intelligent Systems and Informatics (SISY)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7311168\/7325349\/07325368.pdf?arnumber=7325368","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,25]],"date-time":"2017-03-25T00:48:46Z","timestamp":1490402926000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7325368\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,9]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/sisy.2015.7325368","relation":{},"subject":[],"published":{"date-parts":[[2015,9]]}}}