{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T04:15:32Z","timestamp":1725596132515},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,6]]},"DOI":"10.1109\/smacd.2017.7981566","type":"proceedings-article","created":{"date-parts":[[2017,7,17]],"date-time":"2017-07-17T16:43:57Z","timestamp":1500309837000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Comparing apples and oranges: Evaluating model-coverage using acceptance regions"],"prefix":"10.1109","author":[{"given":"Martin","family":"Grabmann","sequence":"first","affiliation":[]},{"given":"Georg","family":"Giaser","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Functional Verification Coverage Measurement and Analysis","year":"2007","author":"piziali","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3850\/9783981537079_1010"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/9780470665121"},{"key":"ref5","article-title":"Feature based State Space Coverage of Analog Circuits","author":"f\u00fcrtig","year":"2016","journal-title":"Forum on Design Languages"},{"key":"ref2","article-title":"Knowing Your AMS System's Limits: System Acceptance Region Exploration by Using Automated Model Refinement and Accelerated Simulation","author":"gl\u00e4ser","year":"2016","journal-title":"Forum on Specification and Design Languages"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0249"}],"event":{"name":"2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","start":{"date-parts":[[2017,6,12]]},"location":"Giardini Naxos, Italy","end":{"date-parts":[[2017,6,15]]}},"container-title":["2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7970054\/7981552\/07981566.pdf?arnumber=7981566","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,10,2]],"date-time":"2017-10-02T22:18:03Z","timestamp":1506982683000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7981566\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,6]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/smacd.2017.7981566","relation":{},"subject":[],"published":{"date-parts":[[2017,6]]}}}