{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,28]],"date-time":"2026-05-28T02:23:23Z","timestamp":1779935003828,"version":"3.53.1"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,6]]},"DOI":"10.1109\/smacd.2017.7981593","type":"proceedings-article","created":{"date-parts":[[2017,7,17]],"date-time":"2017-07-17T16:43:57Z","timestamp":1500309837000},"page":"1-4","source":"Crossref","is-referenced-by-count":4,"title":["Importance of IR drops on the modeling of laser-induced transient faults"],"prefix":"10.1109","author":[{"given":"Raphael A. Camponogara","family":"Viera","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Philippe","family":"Maurine","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jean-Max","family":"Dutertre","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Rodrigo Possamai","family":"Bastos","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"crossref","first-page":"168","DOI":"10.1109\/ICVD.2000.812604","article-title":"Estimation of switching noise on power supply lines in deep sub-micron cmos circuits","author":"zhao","year":"2000","journal-title":"VLSI Design 2000 Thirteenth International Conference on"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2010.5724422"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2013.17"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1965.4323904"},{"key":"ref5","article-title":"Electrical modeling of the effect of photoelectric laser fault injection on bulk cmos design","author":"h\u00e9riveaux","year":"2013","journal-title":"39th ISTFA"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2255312"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6532028"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2014.6850664"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2002.805393"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1982.4336490"}],"event":{"name":"2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","location":"Giardini Naxos, Italy","start":{"date-parts":[[2017,6,12]]},"end":{"date-parts":[[2017,6,15]]}},"container-title":["2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7970054\/7981552\/07981593.pdf?arnumber=7981593","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,30]],"date-time":"2019-09-30T12:42:54Z","timestamp":1569847374000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7981593\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,6]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/smacd.2017.7981593","relation":{},"subject":[],"published":{"date-parts":[[2017,6]]}}}