{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T02:09:29Z","timestamp":1729649369179,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,6]]},"DOI":"10.1109\/smacd.2017.7981609","type":"proceedings-article","created":{"date-parts":[[2017,7,17]],"date-time":"2017-07-17T20:43:57Z","timestamp":1500324237000},"page":"1-4","source":"Crossref","is-referenced-by-count":6,"title":["An accurate yield estimation approach for multivariate non-normal data in semiconductor quality analysis"],"prefix":"10.1109","author":[{"given":"Ingrid","family":"Kovacs","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marina","family":"Topa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andi","family":"Buzo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Georg","family":"Pelz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/S0305-0483(99)00036-5"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2017.7968213"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146930"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-008-1883-9"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.cam.2010.10.047"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-004-2397-8"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2459042"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-010-2557-y"},{"key":"ref2","first-page":"749","article-title":"A multivariate process capability index over a rectangular solid tolerance zone","volume":"4","author":"che","year":"1994","journal-title":"Statistica Sinica"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"536","DOI":"10.1109\/TSM.2009.2032259","article-title":"A general yield model from design to product engin","volume":"22","author":"guntram","year":"2009","journal-title":"IEEE Trans on Semicond Manuf"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/08982119808919208"}],"event":{"name":"2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","start":{"date-parts":[[2017,6,12]]},"location":"Giardini Naxos, Italy","end":{"date-parts":[[2017,6,15]]}},"container-title":["2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7970054\/7981552\/07981609.pdf?arnumber=7981609","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,30]],"date-time":"2019-09-30T16:41:56Z","timestamp":1569861716000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7981609\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,6]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/smacd.2017.7981609","relation":{},"subject":[],"published":{"date-parts":[[2017,6]]}}}