{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,5]],"date-time":"2025-08-05T12:26:33Z","timestamp":1754396793835},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,7]]},"DOI":"10.1109\/smacd.2018.8434883","type":"proceedings-article","created":{"date-parts":[[2018,8,16]],"date-time":"2018-08-16T17:57:28Z","timestamp":1534442248000},"page":"181-184","source":"Crossref","is-referenced-by-count":6,"title":["On Closing the Gap Between Pre-Simulation and Post-Simulation Results in Nanometer Analog Layouts"],"prefix":"10.1109","author":[{"given":"Po-Cheng","family":"Pan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hung-Wen","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chien-Chia","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abhishek","family":"Patyal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hung-Ming","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tsun-Yu","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","start":{"date-parts":[[2018,7,2]]},"location":"Prague, Czech Republic","end":{"date-parts":[[2018,7,5]]}},"container-title":["2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8410988\/8434559\/08434883.pdf?arnumber=8434883","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,8,16]],"date-time":"2018-08-16T17:58:11Z","timestamp":1534442291000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8434883\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/smacd.2018.8434883","relation":{},"subject":[],"published":{"date-parts":[[2018,7]]}}}