{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,2]],"date-time":"2025-09-02T00:03:41Z","timestamp":1756771421673,"version":"3.44.0"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,7]]},"DOI":"10.1109\/smacd.2019.8795236","type":"proceedings-article","created":{"date-parts":[[2019,8,15]],"date-time":"2019-08-15T19:22:56Z","timestamp":1565896976000},"page":"65-68","source":"Crossref","is-referenced-by-count":0,"title":["1 Adaptive defect simulation flow for Defect-oriented Test evaluation"],"prefix":"10.1109","author":[{"given":"Valentin","family":"Gutierrez","sequence":"first","affiliation":[{"name":"CSIC-Universidad de Sevilla, Instituto de Microelectrónica de Sevilla, Av. Américo Vespucio 28, Sevilla, 41092, Spain"}]},{"given":"Gildas","family":"Leger","sequence":"additional","affiliation":[{"name":"CSIC-Universidad de Sevilla, Instituto de Microelectrónica de Sevilla, Av. Américo Vespucio 28, Sevilla, 41092, Spain"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2360458"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-010-5193-4"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2019.2894534"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2009.123"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/5.259424"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/43.9188"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035281"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2017.7995200"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2018.8474109"},{"key":"ref1","first-page":"719","article-title":"Boosting SER test for RF transceivers by simple DSP technique","author":"d?browski","year":"2007","journal-title":"Proceedings -Design Automation and Test in Europe DATE"}],"event":{"name":"2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","start":{"date-parts":[[2019,7,15]]},"location":"Lausanne, Switzerland","end":{"date-parts":[[2019,7,18]]}},"container-title":["2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8786808\/8795217\/08795236.pdf?arnumber=8795236","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T19:16:31Z","timestamp":1756754191000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8795236\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/smacd.2019.8795236","relation":{},"subject":[],"published":{"date-parts":[[2019,7]]}}}