{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,24]],"date-time":"2025-08-24T00:01:31Z","timestamp":1755993691535,"version":"3.44.0"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,7]]},"DOI":"10.1109\/smacd.2019.8795278","type":"proceedings-article","created":{"date-parts":[[2019,8,15]],"date-time":"2019-08-15T19:22:56Z","timestamp":1565896976000},"page":"77-80","source":"Crossref","is-referenced-by-count":2,"title":["Post-Production Calibration of Analog\/RF ICs: Recent Developments and A Fully Integrated Solution"],"prefix":"10.1109","author":[{"given":"Angelos","family":"Antonopoulos","sequence":"first","affiliation":[{"name":"The University of Texas at Dallas, Richardson, TX, 75080"}]},{"given":"Georgios","family":"Volanis","sequence":"additional","affiliation":[{"name":"The University of Texas at Dallas, Richardson, TX, 75080"}]},{"given":"Yichuan","family":"Lu","sequence":"additional","affiliation":[{"name":"The University of Texas at Dallas, Richardson, TX, 75080"}]},{"given":"Yiorgos","family":"Makris","sequence":"additional","affiliation":[{"name":"The University of Texas at Dallas, Richardson, TX, 75080"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-018-5724-y"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3850\/9783981537079_0263"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2009454"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2014.2361716"},{"key":"ref14","first-page":"1","article-title":"Knob non-idealities in learning-based post-production tuning of ana-log\/RF ICs: Impact & remedies","author":"lu","year":"2017","journal-title":"IEEE VLSI Test Symposium (VTS)"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699272"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2015.7342415"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624893"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2805641"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477297"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2424211"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7539168"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2018.8474078"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2598184"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2019.2899054"}],"event":{"name":"2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","start":{"date-parts":[[2019,7,15]]},"location":"Lausanne, Switzerland","end":{"date-parts":[[2019,7,18]]}},"container-title":["2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8786808\/8795217\/08795278.pdf?arnumber=8795278","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T00:39:06Z","timestamp":1755909546000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8795278\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/smacd.2019.8795278","relation":{},"subject":[],"published":{"date-parts":[[2019,7]]}}}