{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,24]],"date-time":"2025-08-24T00:01:35Z","timestamp":1755993695169,"version":"3.44.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,7]]},"DOI":"10.1109\/smacd.2019.8795292","type":"proceedings-article","created":{"date-parts":[[2019,8,15]],"date-time":"2019-08-15T19:22:56Z","timestamp":1565896976000},"page":"69-72","source":"Crossref","is-referenced-by-count":1,"title":["Feature selection and feature design for machine learning indirect test: a tutorial review"],"prefix":"10.1109","author":[{"given":"Manuel J.","family":"Barragan","sequence":"first","affiliation":[{"name":"CNRS, Grenoble INP, TIMA, Univ. Grenoble Alpes, Grenoble, F-38000, France"}]},{"given":"Gildas","family":"Leger","sequence":"additional","affiliation":[{"name":"Instituto de Microlectrònica de Sevilla, CSIC-Universidad de Sevilla, Seville, 41092, Spain"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2017196"},{"key":"ref11","first-page":"1","article-title":"Efficient selection of signatures for ana-log\/RF alternate test","author":"barragan","year":"2013","journal-title":"European Test Symposium"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2501309"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2012.6231074"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2015.09.014"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0004-3702(97)00043-X"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1214\/09-AOAS312"},{"key":"ref17","first-page":"371","article-title":"Causal Explorer: A Causal Probabilistic Network Learning Toolkit for Biomedical Discovery","volume":"3","author":"aliferis","year":"2003","journal-title":"Int Conf on Mathematics and Engineering Techniques in Medicine and Biological Sciences METMBS"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-010-5193-4"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401587"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364477"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2007.895531"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2018.8400689"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2014.2361722"},{"key":"ref7","article-title":"Automatic multitone alternate test generation for RF circuits using behavioral models","author":"halder","year":"2003","journal-title":"Int Test Conference"},{"key":"ref2","article-title":"An introduction to variable and feature selection","volume":"3","author":"guyon","year":"2003","journal-title":"Journal of Machine Learning Research"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670860"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2016.05.003"}],"event":{"name":"2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","start":{"date-parts":[[2019,7,15]]},"location":"Lausanne, Switzerland","end":{"date-parts":[[2019,7,18]]}},"container-title":["2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8786808\/8795217\/08795292.pdf?arnumber=8795292","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T00:39:07Z","timestamp":1755909547000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8795292\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/smacd.2019.8795292","relation":{},"subject":[],"published":{"date-parts":[[2019,7]]}}}