{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T19:19:25Z","timestamp":1754162365644,"version":"3.41.2"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T00:00:00Z","timestamp":1751846400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T00:00:00Z","timestamp":1751846400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,7,7]]},"DOI":"10.1109\/smacd65553.2025.11091949","type":"proceedings-article","created":{"date-parts":[[2025,7,29]],"date-time":"2025-07-29T18:20:27Z","timestamp":1753813227000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A Scalable Authentication Scheme for Detecting Unauthorized Dice in A Multi-Die IC"],"prefix":"10.1109","author":[{"given":"Zheng-Hao","family":"Wang","sequence":"first","affiliation":[{"name":"National Tsing Hua University,Electrical Engineering Department,Taiwan"}]},{"given":"Shi-Yu","family":"Huang","sequence":"additional","affiliation":[{"name":"National Tsing Hua University,Electrical Engineering Department,Taiwan"}]},{"given":"Chi-Kang","family":"Chen","sequence":"additional","affiliation":[{"name":"Taiwan Electronic System Design Automation,Taiwan"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2020.3020777"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2016.2615609"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2930532"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISC251055.2020.9239061"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.06.083"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/s20072041"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2930532"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2024.3387568"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2021.3059454"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2020.3021917"},{"journal-title":"IEEE Std 1149.1-2001","article-title":"IEEE Standard Test Access Port and Boundary-Scan Architecture","year":"2001","key":"ref11"},{"volume-title":"Syntacore. SCR1","key":"ref12"}],"event":{"name":"2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)","start":{"date-parts":[[2025,7,7]]},"location":"Istanbul, Turkiye","end":{"date-parts":[[2025,7,10]]}},"container-title":["2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11091816\/11091606\/11091949.pdf?arnumber=11091949","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,30]],"date-time":"2025-07-30T05:17:56Z","timestamp":1753852676000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11091949\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,7]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/smacd65553.2025.11091949","relation":{},"subject":[],"published":{"date-parts":[[2025,7,7]]}}}