{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T19:26:53Z","timestamp":1754162813066,"version":"3.41.2"},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T00:00:00Z","timestamp":1751846400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,7]],"date-time":"2025-07-07T00:00:00Z","timestamp":1751846400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100004334","name":"Merck","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100004334","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,7,7]]},"DOI":"10.1109\/smacd65553.2025.11092034","type":"proceedings-article","created":{"date-parts":[[2025,7,29]],"date-time":"2025-07-29T18:20:27Z","timestamp":1753813227000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Simulation Study of the Maximum Power Dissipation-Energy Consumption Dilemma in Memristors Using the Dynamic Memdiode Model"],"prefix":"10.1109","author":[{"given":"E.","family":"Miranda","sequence":"first","affiliation":[{"name":"Universitat Autònoma de Barcelona,Departament d’Enginyeria Electrònica,Cerdanyola del Vallès,Spain,08193"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Piros","sequence":"additional","affiliation":[{"name":"Universität Darmstadt,Institute of Materials Science Technische,Darmstadt,Germany,64287"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F. L.","family":"Aguirre","sequence":"additional","affiliation":[{"name":"Intrinsic Semiconductor Ltd.,London,United Kingdom"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"X.","family":"P\u00e9rez","sequence":"additional","affiliation":[{"name":"Universitat Autònoma de Barcelona,Departament d’Enginyeria Electrònica,Cerdanyola del Vallès,Spain,08193"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Kim","sequence":"additional","affiliation":[{"name":"Universität Darmstadt,Institute of Materials Science Technische,Darmstadt,Germany,64287"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. P.","family":"Schreyer","sequence":"additional","affiliation":[{"name":"Universität Darmstadt,Institute of Materials Science Technische,Darmstadt,Germany,64287"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Gehrunger","sequence":"additional","affiliation":[{"name":"Technische Universität Darmstadt,Electrical and Information Engineering,Darmstadt,Germany,64283"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Oster","sequence":"additional","affiliation":[{"name":"Technische Universität Darmstadt,Electrical and Information Engineering,Darmstadt,Germany,64283"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Hofmann","sequence":"additional","affiliation":[{"name":"Technische Universität Darmstadt,Electrical and Information Engineering,Darmstadt,Germany,64283"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Su\u00f1\u00e9","sequence":"additional","affiliation":[{"name":"Universitat Autònoma de Barcelona,Departament d’Enginyeria Electrònica,Cerdanyola del Vallès,Spain,08193"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Hochberger","sequence":"additional","affiliation":[{"name":"Technische Universität Darmstadt,Electrical and Information Engineering,Darmstadt,Germany,64283"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Alff","sequence":"additional","affiliation":[{"name":"Universität Darmstadt,Institute of Materials Science Technische,Darmstadt,Germany,64287"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3389\/fbioe.2016.00097"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tnano.2017.2677882"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2017.04.039"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-020-05687-3"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/led.2021.3063239"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/5.0048526"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s11063-021-10600-z"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/nano12010063"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/acdae0"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.mssp.2023.107878"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.3319591"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tnano.2014.2340571"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1103\/physrevapplied.21.014027"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s00339-011-6264-9"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.3035638"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/mi13020330"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/led.2023.3298023"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/electronics13132480"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1039\/c8fd00116b"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.06.120"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.physleta.2015.12.024"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1515\/ntrev-2018-0045"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1088\/2634-4386\/ac781a"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3226447"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/led.2024.3368146"}],"event":{"name":"2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)","start":{"date-parts":[[2025,7,7]]},"location":"Istanbul, Turkiye","end":{"date-parts":[[2025,7,10]]}},"container-title":["2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11091816\/11091606\/11092034.pdf?arnumber=11092034","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,30]],"date-time":"2025-07-30T18:39:00Z","timestamp":1753900740000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11092034\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,7]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/smacd65553.2025.11092034","relation":{},"subject":[],"published":{"date-parts":[[2025,7,7]]}}}