{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,9]],"date-time":"2026-07-09T11:59:44Z","timestamp":1783598384939,"version":"3.55.0"},"reference-count":31,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,17]],"date-time":"2021-10-17T00:00:00Z","timestamp":1634428800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,17]],"date-time":"2021-10-17T00:00:00Z","timestamp":1634428800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,17]],"date-time":"2021-10-17T00:00:00Z","timestamp":1634428800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100002186","name":"Lockheed Martin","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100002186","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100006602","name":"Air Force Research Laboratory","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006602","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,17]]},"DOI":"10.1109\/smc52423.2021.9659140","type":"proceedings-article","created":{"date-parts":[[2022,1,6]],"date-time":"2022-01-06T20:34:35Z","timestamp":1641501275000},"page":"1927-1934","source":"Crossref","is-referenced-by-count":21,"title":["A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection"],"prefix":"10.1109","author":[{"given":"Nana","family":"Kankam Gyimah","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Abenezer","family":"Girma","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mahmoud","family":"Nabil Mahmoud","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shamila","family":"Nateghi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Abdollah","family":"Homaifar","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Daniel","family":"Opoku","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.3390\/jimaging7030046"},{"key":"ref30","first-page":"1","article-title":"Comparison and analysis of logistic regression, Na?ve Bayes and KNN machine learning algorithms for credit card fraud detection","author":"itoo","year":"2020","journal-title":"International Journal of Information Technology"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-018-1415-x"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1504\/IJCAT.2012.045840"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IPAS.2016.7880062"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/app8091628"},{"key":"ref14","first-page":"643","article-title":"Deep learning for control: the state of the art and prospects","volume":"42","author":"duan","year":"2016","journal-title":"ACTA Automatica Sinica"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s11771-016-3350-3"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/INMIC.2008.4777721"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1177\/1729881417703114"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2852918"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S1006-706X(13)60102-8"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/83.862633"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2016.09.002"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1137\/040616024"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/s19030644"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2002.1017623"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.2307\/2337118"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-8856(02)00152-X"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s12613-013-0690-y"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"1657","DOI":"10.1109\/TIP.2010.2044957","article-title":"A completed modeling of local binary pattern operator for texture classification","volume":"19","author":"guo","year":"2010","journal-title":"IEEE Transactions on Image Processing"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/app8112195"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2013.09.002"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/s20185136"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1364\/AO.50.005122"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICDIP.2009.68"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CISP.2008.278"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/s120810788"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICMLC.2005.1527830"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s11760-012-0389-y"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.01.011"}],"event":{"name":"2021 IEEE International Conference on Systems, Man, and Cybernetics (SMC)","location":"Melbourne, Australia","start":{"date-parts":[[2021,10,17]]},"end":{"date-parts":[[2021,10,20]]}},"container-title":["2021 IEEE International Conference on Systems, Man, and Cybernetics (SMC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9658572\/9658575\/09659140.pdf?arnumber=9659140","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:56:29Z","timestamp":1652201789000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9659140\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,17]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/smc52423.2021.9659140","relation":{},"subject":[],"published":{"date-parts":[[2021,10,17]]}}}