{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,5]],"date-time":"2026-08-05T04:52:03Z","timestamp":1785905523642,"version":"3.56.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,1]],"date-time":"2023-10-01T00:00:00Z","timestamp":1696118400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,1]]},"DOI":"10.1109\/smc53992.2023.10393899","type":"proceedings-article","created":{"date-parts":[[2024,1,29]],"date-time":"2024-01-29T18:32:04Z","timestamp":1706553124000},"page":"2258-2263","source":"Crossref","is-referenced-by-count":3,"title":["Real-Time Defect Detection Network Based on Hybrid Attention Mechanism for Small-Size Printed Circuit Boards"],"prefix":"10.1109","author":[{"given":"Congcong","family":"Wang","sequence":"first","affiliation":[{"name":"Qilu University of Technology (Shandong Academy of Sciences),China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiumei","family":"Wei","sequence":"additional","affiliation":[{"name":"Qilu University of Technology (Shandong Academy of Sciences),China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaoming","family":"Wu","sequence":"additional","affiliation":[{"name":"Qilu University of Technology (Shandong Academy of Sciences),China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xuesong","family":"Jiang","sequence":"additional","affiliation":[{"name":"Qilu University of Technology (Shandong Academy of Sciences),China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2915404"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-022-07192-7"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2982115"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2019.2902657"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.15376\/biores.16.3.5390-5406"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP39728.2021.9414568"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01155"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2853958"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2021.101272"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2871750"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2016.7727522"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3008021"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3201945"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3208580"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3168897"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.seta.2021.101032"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v34i07.6999"},{"key":"ref18","article-title":"Online pcb defect detector on a new pcb defect dataset","author":"Tang","year":"2019","journal-title":"arXiv preprint"}],"event":{"name":"2023 IEEE International Conference on Systems, Man, and Cybernetics (SMC)","location":"Honolulu, Oahu, HI, USA","start":{"date-parts":[[2023,10,1]]},"end":{"date-parts":[[2023,10,4]]}},"container-title":["2023 IEEE International Conference on Systems, Man, and Cybernetics (SMC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10391856\/10393862\/10393899.pdf?arnumber=10393899","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,3]],"date-time":"2024-03-03T06:50:42Z","timestamp":1709448642000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10393899\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,1]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/smc53992.2023.10393899","relation":{},"subject":[],"published":{"date-parts":[[2023,10,1]]}}}