{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,21]],"date-time":"2025-01-21T07:10:26Z","timestamp":1737443426764,"version":"3.33.0"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,6]],"date-time":"2024-10-06T00:00:00Z","timestamp":1728172800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,6]],"date-time":"2024-10-06T00:00:00Z","timestamp":1728172800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,6]]},"DOI":"10.1109\/smc54092.2024.10831039","type":"proceedings-article","created":{"date-parts":[[2025,1,20]],"date-time":"2025-01-20T18:39:20Z","timestamp":1737398360000},"page":"827-832","source":"Crossref","is-referenced-by-count":0,"title":["An Efficient Token Mixer Model for Sheet Metal Defect Detection"],"prefix":"10.1109","author":[{"given":"Huijuan","family":"Hao","sequence":"first","affiliation":[{"name":"Qilu University of Technology (Shandong Academy of Sciences),Key Laboratory of Computing Power Network and Information Security, Ministry of Education, Shandong Computer Science Center (National Supercomputer Center in Jinan),Jinan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sijian","family":"Zhu","sequence":"additional","affiliation":[{"name":"Qilu University of Technology (Shandong Academy of Sciences),Key Laboratory of Computing Power Network and Information Security, Ministry of Education, Shandong Computer Science Center (National Supercomputer Center in Jinan),Jinan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Changle","family":"Yi","sequence":"additional","affiliation":[{"name":"Qilu University of Technology (Shandong Academy of Sciences),Key Laboratory of Computing Power Network and Information Security, Ministry of Education, Shandong Computer Science Center (National Supercomputer Center in Jinan),Jinan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yu","family":"Chen","sequence":"additional","affiliation":[{"name":"Qilu University of Technology (Shandong Academy of Sciences),Key Laboratory of Computing Power Network and Information Security, Ministry of Education, Shandong Computer Science Center (National Supercomputer Center in Jinan),Jinan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hongge","family":"Zhao","sequence":"additional","affiliation":[{"name":"Qilu University of Technology (Shandong Academy of Sciences),Key Laboratory of Computing Power Network and Information Security, Ministry of Education, Shandong Computer Science Center (National Supercomputer Center in Jinan),Jinan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yue","family":"Feng","sequence":"additional","affiliation":[{"name":"Qilu University of Technology (Shandong Academy of Sciences),Key Laboratory of Computing Power Network and Information Security, Ministry of Education, Shandong Computer Science Center (National Supercomputer Center in Jinan),Jinan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rong","family":"Yang","sequence":"additional","affiliation":[{"name":"Qilu University of Technology (Shandong Academy of Sciences),Key Laboratory of Computing Power Network and Information Security, Ministry of Education, Shandong Computer Science Center (National Supercomputer Center in Jinan),Jinan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TII.2018.2887145"},{"issue":"7","key":"ref2","first-page":"3049","article-title":"Automatic recognition of surface defects on hot-rolled steel strip using scattering convolution network","volume":"10","author":"Song","year":"2014","journal-title":"J. Comput. Inf. Syst."},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TPAMI.2015.2437384"},{"key":"ref4","article-title":"ultralytics\/yolov5: v6.2-yolov5 classification models, apple m1, reproducibility, clearml and deci.ai integrations","author":"Jocher","year":"2022","journal-title":"Zenodo"},{"key":"ref5","article-title":"YOLOv6: A single-stage ob-ject detection framework for industrial applications","author":"Li","year":"2022","journal-title":"arXiv preprint"},{"key":"ref6","article-title":"You only learn one representation: Unified network for multiple tasks","author":"Wang","year":"2021","journal-title":"arXiv preprint"},{"key":"ref7","article-title":"PP- YOLOE: An evolved version of YOLO","author":"Xu","year":"2022","journal-title":"arXiv preprint"},{"key":"ref8","article-title":"PP-PicoDet: A better real-time object detector on mobile devices","author":"Yu","year":"2021","journal-title":"arXiv preprint"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.48550\/ARXIV.1807.06521"},{"key":"ref10","article-title":"An image is worth 16\u00d716 words: Transformers for image recognition at scale","author":"Dosovitskiy","year":"2020","journal-title":"arXiv preprint"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/CVPR.2016.90"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/CVPR.2017.243"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/CVPR52688.2022.01167"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.48550\/ARXIV.1706.03762"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/ICCV48922.2021.00986"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/ICCV48922.2021.00061"},{"key":"ref17","article-title":"Next-vit: Next generation vision trans-former for efficient deployment in realistic industrial scenarios","author":"Li","year":"2022","journal-title":"arXiv preprint"},{"key":"ref18","first-page":"3965","article-title":"Coatnet: Marrying convolution and attention for all data sizes","volume":"34","author":"Dai","year":"2021","journal-title":"Advances in Neural Information Processing Systems"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/CVPR52688.2022.01186"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/ICCV48922.2021.00009"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/CVPR52688.2022.01055"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/CVPR46437.2021.01625"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1007\/978-3-031-20053-3_28"}],"event":{"name":"2024 IEEE International Conference on Systems, Man, and Cybernetics (SMC)","start":{"date-parts":[[2024,10,6]]},"location":"Kuching, Malaysia","end":{"date-parts":[[2024,10,10]]}},"container-title":["2024 IEEE International Conference on Systems, Man, and Cybernetics (SMC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10830919\/10830920\/10831039.pdf?arnumber=10831039","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,21]],"date-time":"2025-01-21T06:37:22Z","timestamp":1737441442000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10831039\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,6]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/smc54092.2024.10831039","relation":{},"subject":[],"published":{"date-parts":[[2024,10,6]]}}}